News & Events

Research on the microscopic behavior of materials is entering a new era of multi-scenario coupling and in-situ dynamic characterization. CIQTEK has launched an innovative In-situ Mechanical Testing Solution, designed with outstanding openness and compatibility. It enables seamless integration of CIQTEK’s full range of electron microscopes with mainstream in-situ testing devices, providing a flexible and efficient platform for coupled analysis in diverse research scenarios.   Breaking the limitations of closed systems, the solution integrates all critical elements required for in-situ EM adaptability, featuring: High beam current: >100 nA, ideal for fast EDS/EBSD analysis Large space: 360 × 310 × 288 mm (L × W × H) High load capacity: 5 kg (up to 10 kg with custom fixtures) Multi-view CCDs: ensuring system safety during in-situ operation Multiple interfaces: supporting customized flange accessories Pre-acceptance: full accessory debugging before delivery, ensuring complete functionality without on-site installation issues The solution can be configured across CIQTEK’s full range of electron microscopy products, including CIQTEK SEM3200, SEM5000X, DB550 dual-beam systems, and more. It also offers seamless compatibility with tensile stages, heating stages, nanoindenters, and electrochemical workstations from world-leading suppliers. This open architecture enables researchers to flexibly combine the most suitable equipment, maximizing experimental performance.   CIQTEK’s in-situ stage solution supported customers in publishing a high-impact paper (DOI: 10.1126/science.adq6807).   CIQTEK’s In-situ Mechanical Solution also supports multi-field coupling (mechanical, thermal, electrochemical), enabling nanoscale real-time observation of materials under complex environments. By synchronizing high-resolution imaging with in-situ signals, researchers can capture critical phenomena such as crack propagation, phase transitions, and interfacial reactions with precision. With a temperature range of -170 to 1200 °C, advanced load control, and rapid response systems, it accurately simulates service conditions of materials across various industries. Combined with EBSD and EDS, it provides comprehensive datasets for understanding material behavior under coupled stimuli.   Successfully applied in aerospace materials, new energy devices, and biomedical materials, this solution demonstrates CIQTEK’s exceptional compatibility and scalability in advanced electron microscopy platforms.

Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most cutting-edge directions in electron microscopy. By performing a two-dimensional scan across the sample surface while recording a full diffraction pattern at each scan point with a pixelated detector, 4D-STEM generates a four-dimensional dataset containing both real-space and reciprocal-space information. This technique breaks through the limitations of conventional electron microscopy that typically collects only a single scattering signal. Instead, it captures and analyzes the entire spectrum of electron–sample interactions. With 4D-STEM, researchers can achieve multiple advanced functionalities within a single experiment, including virtual imaging, crystal orientation and strain mapping, electric and magnetic field distribution analysis (differential phase contrast), and even atomic-resolution reconstruction through diffraction stacking. It greatly expands the dimensionality and depth of materials characterization, offering an unprecedented tool for nanoscience and materials research.   At the Chinese National Conference on Electron Microscopy 2025 (Sept 26–30, Wuhan), CIQTEK releases its 4D-STEM solution, designed to break through the boundaries of traditional imaging and deliver data with unmatched dimensionality and analytical power.   System Workflow   The CIQTEK 4D-STEM solution features high spatial resolution, multi-dimensional analysis, low-dose operation to minimize beam damage, and flexible data processing, providing researchers with reliable and outstanding methods for advanced materials analysis.

In the fields of high-temperature material performance research and phase transition mechanism analysis, traditional external heating methods often fail to combine precise micro-region temperature control with real-time observation.   CIQTEK, in collaboration with the Micro-Nano Center of the University of Science and Technology of China, has developed an innovative in-situ heating chip solution. By integrating MEMS heating chips with dual-beam electron microscopes, this solution enables precise temperature control (from room temperature to 1100°C) and micro-dynamic analysis of samples, offering a new tool for studying material behavior in high-temperature environments. This solution uses the CIQTEK dual-beam SEM and specialized MEMS heating chips, with temperature control accuracy better than 0.1°C and temperature resolution better than 0.1°C. The system also features excellent temperature uniformity and low infrared radiation, ensuring stable analysis at high temperatures. The system supports various characterization techniques during heating, including micro-region morphology observation, EBSD crystal orientation analysis, and EDS composition analysis. This allows for a comprehensive understanding of phase transitions, stress evolution, and composition migration under thermal effects.   The system operates without breaking the vacuum, fulfilling the full process requirements for sample preparation and characterization (in-situ micro-region EBSD).   The integrated workflow design covers the entire process, from sample preparation (ion beam processing, nano-manipulator extraction) to in-situ welding and heating tests. The system supports multi-angle operation, featuring a 45° heating chip and a 36° copper grid position, which meet the complex experimental needs. The system has been successfully applied in high-temperature performance research of alloys, ceramics, and semiconductors, helping users gain deeper insights into material responses in real-world environments.     September 26–30, Wuhan | 2025 Chinese National Conference on Electron MicroscopyCIQTEK's eight major electron microscopy solutions will be showcased!

CIQTEK has introduced its next-generation 12-inch wafer scanning electron microscope (SEM) solution, designed to meet the demands of advanced semiconductor manufacturing processes. Offering full-wafer inspection without the need for rotation or tilting, this innovative solution ensures high-resolution, non-destructive analysis to support critical process development. Equipped with an ultra-large travel stage (X/Y ≥ 300 mm), the system provides complete coverage of 12-inch wafers, eliminating the need for sample cutting or transfer. This ensures true "original size, original position" observation. With a Schottky field emission electron gun, it achieves a resolution of 1.0 nm at 15 kV and 1.5 nm at 1 kV, minimizing electron beam damage, making it ideal for sensitive materials and structures.     Key features include: Ultra-large travel stage (X/Y > 300 mm) for full-wafer inspection High-resolution imaging: 1.0 nm at 15 kV and 1.5 nm at 1 kV Automated loading and optical navigation system for fast wafer exchange and precise positioning Intelligent software for auto-focus, astigmatism correction, and multi-format image output   CIQTEK's 12-inch wafer inspection SEM is more than just an observation tool; it's a critical instrument driving higher yields and smaller nodes in semiconductor manufacturing.   September 26–30, WuhanCIQTEK will unveil eight cutting-edge electron microscopy solutions at the 2025 Chinese National Conference on Electron Microscopy!

In the fields of life sciences, biomedicine, food inspection, and soft matter research, achieving high-resolution imaging of hydrated and beam-sensitive samples has always been a major challenge. Conventional sample preparation methods, such as chemical fixation, dehydration, and drying, often result in shrinkage, deformation, or structural damage, leading to results that deviate from the true state of the sample.   Leveraging its advanced scanning electron microscopy technology, CIQTEK has introduced the Cryo-SEM Solution, which integrates low-temperature freezing and vacuum transfer. This enables in-situ, non-destructive, and high-fidelity microscopic observation of biological and sensitive samples, truly “freezing” the microscopic details of life.   With liquid-nitrogen slush rapid-freezing technology, samples can be vitrified instantly at -210 °C, preserving their original morphology and chemical composition to the greatest extent. The integrated cryo-preparation system combines freeze-fracture, sublimation coating, and low-temperature transfer, avoiding the complexity and potential errors of conventional manual preparation. Throughout the entire process, samples are maintained under cryogenic vacuum conditions and transferred to the SEM cryo-stage, where high-resolution imaging at -180 °C effectively suppresses electron beam damage and significantly improves image quality.   Cryo-prepared boxwood leaf showing intact vein structures, while the untreated sample exhibits severe shrinkage.   Yogurt   Mold Cryo-prepared yogurt sample clearly reveals protein networks and fungal hyphae.   In addition, the system offers strong compatibility, adaptable across CIQTEK's full range of SEMs and dual-beam FIBSEM systems, meeting diverse needs from routine observation to advanced analysis.   The CIQTEK Cryo-SEM Solution is more than just a set of instruments. It embodies a scientific approach dedicated to faithfully restoring the microscopic world. It empowers researchers to overcome technical limitations, capture critical details at the micro scale of life, and drive both fundamental research and applied development to new heights.   September 26–30, Wuhan At the 2025 Chinese National Electron Microscopy Academic Conference, CIQTEK will unveil eight cutting-edge EM solutions. Stay tuned!

CIQTEK is pleased to announce the successful installation and training of the FIBSEM DB550 at our Korean distributor GSEM’s Electron Microscope Center. This milestone marks an important step in expanding access to advanced focused ion beam scanning electron microscope (FIBSEM) technology in South Korea.     The DB550 combines high-resolution imaging with precise ion beam milling, enabling researchers to perform 3D reconstruction, cross-sectional analysis, and nanoscale material modification with efficiency and accuracy. With these capabilities, the system opens new possibilities for semiconductor analysis, materials science, and life science research. Following installation, CIQTEK engineers provided hands-on training to the GSEM team, covering both standard workflows and advanced applications. The interactive sessions ensured that users gained practical experience in operating the instrument, from sample preparation to high-resolution imaging and data analysis. The enthusiasm and engagement of the GSEM team highlighted the strong potential for the DB550 to support diverse research projects at the center.     This collaboration reflects CIQTEK’s commitment to working closely with partners worldwide. By equipping GSEM’s facility with the DB550, we are not only strengthening our presence in the Korean market but also helping local researchers gain access to cutting-edge tools for scientific innovation. We look forward to seeing the exciting results that GSEM’s Electron Microscope Center will achieve with the DB550, and we remain committed to providing ongoing technical support and collaboration.  

In June 2025, CIQTEK successfully delivered two advanced scanning electron microscopes to its U.S. distributor, JH Technologies, in Fremont, California. The systems include the SEM3300 Tungsten Filament SEM and the SEM5000X Ultra-High Resolution Field Emission SEM, marking a significant step in CIQTEK's strategic expansion into the North American electron microscopy market.     To support the deployment, CIQTEK’s engineering team provided comprehensive on-site training to the JH Technologies team. This included detailed system operation, application demonstrations, and technical discussions tailored to real-world use cases. The collaboration enhanced the JH team’s capabilities in showcasing and supporting CIQTEK instruments.     Following the delivery, JH Technologies hosted a successful Open House at its Fremont facility, featuring live demonstrations of both systems. The event attracted strong attendance from academic and industry professionals, generating significant interest and positive feedback. Encouraged by the success, JH Technologies plans to organize more Open House events shortly to promote CIQTEK’s advanced imaging solutions further.     Proven Imaging Technology for Demanding Applications The SEM3300 combines a traditional tungsten filament source with modern optics, offering high-resolution performance at low accelerating voltages. It provides a powerful yet accessible solution for routine analysis and research. The SEM5000X delivers ultra-high resolution imaging and advanced automation features, making it ideal for materials science, semiconductor inspection, and nanotechnology research. Both systems offer intuitive user interfaces and flexible configuration options to meet diverse application needs.   Looking Ahead CIQTEK’s collaboration with JH Technologies reflects a shared vision of delivering world-class SEM instruments supported by strong local expertise. By combining performance, usability, and accessibility, CIQTEK is rapidly gaining traction among U.S. users in research, manufacturing, and education. Aleks Zhang, Deputy Director of Overseas Business Group at CIQTEK, commented, “We are proud to see our SEM instruments in the hands of such a professional and capable partner. The momentum in the U.S. market is strong, and we are committed to deepening our support for local customers through close cooperation with distributors like JH Technologies.”  

On June 20, 2025, representatives of the Beijing Physical & Chemistry Testing Technology Society visited CIQTEK. A special seminar on “Innovation and Application of Magnetic Resonance Spectroscopy Technology” was held, along with on-site Nuclear Magnetic Resonance (NMR) data testing and comparison. The Beijing Physical & Chemistry Testing Technology Society was established in 1980 as an academic organization voluntarily formed by experts in the analytical testing industry in the Beijing area. Its purpose is to unite and organize professionals in the analytical testing field within Beijing, promoting the development of analytical testing technologies. The society currently has over 1,000 members.   CIQTEK Launched NMR Spectrometer, Impressed Visiting Experts with On-site Performance At the Beijing Spectroscopy Conference held from May 23 to 25, 2025, CIQTEK President Dr. Max He officially announced the new products — the 400 MHz and 600 MHz NMR spectrometers. Although Dr. Max's presentation featured only a few slides on CIQTEK NMR instruments, it sparked considerable interest within the Beijing Physical & Chemistry Testing Technology Society. CIQTEK's emergence as a manufacturer of high-field NMR spectrometers was met with both surprise and excitement. The announcement quickly became a topic of lively discussion, with many experts expressing a strong desire to visit CIQTEK for an in-depth look at the instruments. In response, CIQTEK extended a formal invitation to members of the Beijing Physical & Chemistry Testing Technology Society, including committee members and relevant experts, to visit the company for an on-site evaluation of their NMR research. This marked the Society’s first official delegation visit outside of Beijing.   Group photo of the Beijing Physical & Chemistry Testing Technology Society delegation and the CIQTEK team   On-site Benchmarking: Data Performance, Analysis Speed, and Quantity During the one-day visit, participants engaged in in-depth discussions and hands-on data acquisition. The interaction was highly productive, with both sides delving into technical details and application insights. Numerous questions and suggestions were raised, making the session both interactive and constructive.   Reliable Spectral Data The reliability of spectral data is the primary criterion for evaluating the performance of an NMR spectrometer. Therefore, sensitivity, testing efficiency, and spectral quality were key focuses during this on-site evaluation. During the comparative testing session, two standard samples were prepared for live demonstrations: 0.1% Ethylbenzene — used to evaluate ¹H sensitivity 40% ASTM standard — used to evaluate ¹³C sensitivity   The detailed comparison results are as follows: (1) ¹H sensitivity The test results from other manufacturers are as follows: Brand A: Measured signal-to-noise ratio of 341:1 (sample not s...