News & Events

On October 21, CIQTEK and Queen Mary University of London brought together EPR researchers and specialists from leading European universities for a full day of scientific exchange in London. The programme covered a wide range of topics, from molecular actinides and biometalloclusters to molecular spin systems and next-generation EPR instrumentation. Different Research Questions, One EPR Community The talks showed just how broad modern EPR spectroscopy has become. Researchers from Queen Mary University of London, The University of Manchester, University of Oxford, University of Stuttgart, University of Copenhagen, and CIQTEK shared how EPR is being used to answer very different scientific questions. That variety made the day especially useful. Attendees could compare approaches across chemistry, physics, molecular science, and magnetic resonance rather than looking at EPR from only one angle. The Conversation Continued Around the Instrument After the presentations, the discussion moved from slides to the instrument itself. Attendees gathered around a CIQTEK floor-standing EPR spectrometer on site, continuing the conversation around real hardware, system configuration, experimental workflows, and practical research needs. Questions quickly became more specific: How would a certain experiment be set up? Which configuration would fit a particular research problem? What should researchers consider when moving from an idea to a real EPR measurement? That exchange was one of the most valuable parts of the day. More Conversations to Come By combining scientific talks with direct discussion around the instrument, the workshop created a practical space for researchers to exchange ideas, ask questions, and explore how EPR can support their work. Thank you to everyone who joined us at Queen Mary University of London and helped make the day such a meaningful exchange. CIQTEK plans to organize more EPR seminars, workshops, and scientific exchange events across Europe and the United States in the future. If you are interested in attending, speaking, or collaborating on a similar event, we would be happy to hear from you. Contact us to stay connected and learn about upcoming EPR events!

CIQTEK has officially launched its 200 kV field emission transmission electron microscope, TEM-F200, delivering 0.10 nm information resolution and featuring several key subsystems developed in-house. Unveiled on October 18 at the 2026 National Electron Microscopy Annual Conference in China, the TEM-F200 is designed for demanding work in materials science, semiconductor research, and nanoscale characterization. The launch also marks another step toward a more complete domestic TEM platform, from key hardware to imaging and analysis workflows. Built Around Resolution, Stability, and Practical Use For TEM users, resolution is only part of the story. Stability, ease of operation, detector performance, automation, and service all affect what the microscope can actually deliver day-to-day. The TEM-F200 combines a 200 kV field emission electron source with a self-developed high-voltage power supply and optical system. TEM-F200 Key Specifications 200 kV Field Emission Transmission Electron Microscope Acceleration Voltage 20 to 200 kV Information Resolution 0.10 nm Point Resolution 0.25 nm STEM Resolution 0.16 nm STEM Detector Modes HAADF, ADF, ABF Magnification 20× to 1,200,000× Super-EDS Optional dual 100 mm² windowless SDD detectors with symmetrical geometry, energy resolution ≤127 eV Optional Configurations EELS, 4D-STEM, 3D-ED, in situ sample holder A thermostatic water-cooled objective lens and four-axis sample stage help support stable imaging, while automated aperture control, position memory, and one-click adjustment are designed to reduce repetitive manual work. The main imaging camera is CIQTEK’s self-developed 16-megapixel fiber-coupled CMOS camera, built specifically for TEM use. The camera combines a 9 μm CMOS sensor, 4K × 4K imaging, and up to 24 fps at full resolution. Less Time at the Controls, More Time on the Sample The TEM-F200 also puts a strong focus on workflow. Fluorescent-screen images can be transferred directly to the PC display, while high-voltage control, electron-gun auto-start, vacuum operation, sample-position auto navigation, and STEM detector movement can all be integrated into the system workflow. For laboratories that need more flexibility, the platform can also be expanded with EDS, EELS, 4D-STEM, 3D electron diffraction, side cameras, cryogenic components, and in situ holders. From FinFET Devices to Advanced Alloys The new system has already been demonstrated on a range of demanding samples. For semiconductor FinFET devices, local nanoscale features and fine lattice structures were clearly resolved, with FFT analysis showing a spacing down to 1.045 Å. Semiconductor FinFET Cross-sectional imaging of semiconductor memory chips clearly revealed multilayer thin-film and dielectric structures. For 7075 aerospace aluminum alloy, TEM-BF and STEM-HAADF imaging resolved nanoscale precipitates, discontinuous grain-boundary phases, and precipitate-free zones. The system was also used to e...

CIQTEK officially unveiled its self-developed TEM-F200 200 kV Field Emission Transmission Electron Microscope at the 2026 National Annual Conference on Electron Microscopy in Nanjing, China. The TEM-F200 was the headline launch among five new electron microscopy products introduced during the event. The new lineup also includes the TEM-F120 120 kV Field Emission TEM, SEM5000Ultra Ultra-High-Resolution Field Emission SEM, a purpose-built fiber-coupled CMOS camera for TEM, and CIQTEK SEM Agent. Together, the launches expand CIQTEK's electron microscopy portfolio from complete microscope systems to imaging hardware and intelligent software. A New 200 kV TEM Developed In-House On October 18, CIQTEK Vice President Dr. Cao Feng introduced the TEM-F200 during a conference presentation focused on the development of CIQTEK's 200 kV transmission electron microscopy technology. The system reaches an information resolution of 0.10 nm. Key components, including the high-voltage power supply, electron gun, constant-power water-cooled objective lens, fully automated apertures, and fiber-coupled CMOS camera, were developed in-house. The TEM-F200 is now ready for volume production and delivery. The launch marks an important step in CIQTEK's expansion into higher-end transmission electron microscopy and strengthens its ability to develop complete electron microscopy systems around core technologies. Five New Products Across TEM, SEM, Imaging and AI Alongside the TEM-F200, CIQTEK introduced four additional products covering different parts of the electron microscopy workflow: TEM-F120, a 120 kV Field Emission Transmission Electron Microscope SEM5000Ultra, an Ultra-High-Resolution Field Emission Scanning Electron Microscope A purpose-built fiber-coupled CMOS camera for TEM CIQTEK SEM Agent, an intelligent software platform for electron microscopy These launches extend beyond individual instruments. They cover complete TEM and SEM systems, core imaging components, and AI-powered software, showing a broader approach to electron microscopy development.   From New Instruments to Smarter Microscopy Workflows During the 2026 National Annual Conference on Electron Microscopy, CIQTEK also hosted a series of product sessions covering its TEM portfolio, the new SEM5000Ultra and wider SEM lineup, as well as its AI electron microscopy roadmap and SEM Agent platform. The focus was not simply on adding more instruments. As microscopy workflows become more complex, users increasingly need a combination of high-resolution imaging, stable hardware, automation, and easier operation. By developing complete microscopes, core components, and intelligent software together, CIQTEK is building a more connected electron microscopy platform for materials science, semiconductor research, life science, and other advanced applications.   Expanding CIQTEK's Electron Microscopy Platform CIQTEK also worked with seven industry partners during the conference to showcase technologies and ap...

CIQTEK has wrapped up its participation in the 2026 vEM Technology Forum at Peking University in Beijing, where researchers and microscopy specialists gathered to discuss the latest developments in Volume Electron Microscopy, large-area imaging, automation, and 3D reconstruction. For CIQTEK, the conversations came back to one practical challenge again and again: how to image larger biological volumes faster without giving up the resolution needed to see fine structures. That is exactly where high-speed SEM is becoming increasingly important. From Faster Imaging to Larger Volume EM Workflows At the CIQTEK booth, our team introduced the HEM6000 High-Speed SEM and discussed how high imaging speed, low-kV resolution, automated large-area acquisition, and intelligent workflows can support increasingly data-intensive Volume EM research. For researchers working with large numbers of serial sections or extended regions of interest, acquisition speed is only one part of the workflow. Stable imaging, consistent quality across large areas, and automation become equally important as datasets grow. These topics led to many useful discussions with researchers working on biological imaging, neuroscience, connectomics, and other large-scale microscopy applications. Sharing Our Latest Work on High-Speed SEM During the forum, Dr. Changming Liu (Noah), CIQTEK Senior Electron Microscopy Solution Manager, presented CIQTEK's latest work on high-speed SEM for large-scale Volume EM. The presentation highlighted how the HEM6000 combines high-speed acquisition with low-kV imaging performance, large-area imaging, and automation to make demanding Volume EM workflows more efficient. Rather than treating speed as a standalone specification, the discussion focused on a broader question: how can faster acquisition translate into a more practical workflow for real research? More Conversations Ahead The 2026 vEM Technology Forum was a valuable opportunity to hear directly from the microscopy community about the challenges behind large-scale imaging and data acquisition. Those conversations also give us a clearer view of where electron microscopy workflows are heading: larger datasets, more automation, higher throughput, and stronger demand for reliable high-resolution imaging at scale. CIQTEK will continue developing electron microscopy solutions that help researchers move from individual high-resolution images toward more efficient, large-scale characterization workflows. Thank you to everyone who stopped by, shared ideas, and discussed their research with us in Beijing.

CIQTEK will join Neuroscience 2026, the annual meeting of the Society for Neuroscience, in Washington, D.C. from November 14 to 18. Visit us at Booth #1014 to explore how high-speed electron microscopy can support large-scale biological imaging, connectomics, and volume electron microscopy workflows. Neuroscience 2026 will take place at the Walter E. Washington Convention Center and brings together neuroscientists, imaging specialists, technology providers, and researchers from around the world. High-Speed SEM for Large-Scale Biological Imaging Modern neuroscience increasingly depends on imaging larger areas, larger volumes, and more complex biological structures. For volume electron microscopy, imaging speed matters, but speed alone is not enough. Researchers also need stable low-kV performance, reliable image quality, automated acquisition, and workflows that can handle large datasets efficiently. At Neuroscience 2026, CIQTEK will highlight the HEM6000 High-Speed SEM, developed for demanding applications in biological imaging and large-area electron microscopy. Its capabilities support workflows such as: High-speed large-area imaging Low-kV high-resolution observation Automated image acquisition Serial section imaging Volume EM and 3D reconstruction Neuroscience and connectomics research The goal is to help researchers collect high-quality structural information faster while reducing the time and effort required for large-scale imaging projects. Explore CIQTEK Electron Microscopy Solutions In addition to high-speed SEM, CIQTEK offers a broader electron microscopy portfolio for biological and materials research, including field emission SEM and FIB-SEM systems. Our team will be available to discuss practical questions around sample imaging, throughput, resolution, automation, and workflow design. If you are working with brain tissue, neural structures, connectomics, biological ultrastructure, or large-volume imaging, we would be glad to learn more about your research and discuss which electron microscopy approach may fit your needs. Date: November 14–18, 2026Location: Walter E. Washington Convention Center, Washington, D.C., USACIQTEK Booth: #1014 Meet the CIQTEK team at Booth #1014 and see how faster electron microscopy can support your next neuroscience imaging project.  

Sometimes the most useful microscopy conversations happen away from a formal presentation, with a sample, an image, or a practical question on the table. That was our experience at the 2026 Great Lakes Microscopy Society Annual Meeting, held on October 9 at Michigan Technological University in Houghton, Michigan. CIQTEK joined researchers, students, and microscopy professionals working across electron microscopy, microanalysis, materials science, and biological research. Microscopy Questions, Not Just Instrument Specs Throughout the meeting, our U.S. Electron Microscopy Team had the chance to talk with attendees about what they actually need from an SEM workflow, from routine imaging and materials characterization to higher-resolution and more specialized applications. CIQTEK also shared its broader electron microscopy portfolio, covering field emission SEM, tungsten SEM, high-speed SEM, and FIB-SEM solutions for different research needs. Good Science Starts with Good Conversations GLMS is a smaller, focused meeting, and that made it especially easy to have direct conversations with people doing hands-on microscopy every day. Thank you to everyone who stopped by, asked questions, shared your research, or simply came over for a microscopy chat. For our team, meetings like GLMS are valuable because they help us understand how researchers are actually using electron microscopy, where the challenges are, and what they expect from the next generation of instruments. We look forward to staying connected with the Great Lakes microscopy community and continuing the conversations started in Michigan.

Failure analysis rarely starts with a perfect sample. At ISTFA 2026, the 52nd International Symposium for Testing and Failure Analysis, many of our conversations began with real-world challenges: buried defects, difficult cross sections, subtle material contrast, and structures that require more than surface-level imaging. From October 4 to 8 in San Antonio, Texas, CIQTEK U.S. Electron Microscopy Team met with failure analysis engineers, semiconductor researchers, and microscopy specialists at Booth #317 to discuss practical SEM and FIB-SEM workflows. From Surface Imaging to Buried Defect Analysis Discussions at ISTFA covered a wide range of applications, including: Semiconductor device and wafer inspection High-resolution low-kV imaging Surface defect and morphology analysis Material contrast and contamination analysis Site-specific cross-sectioning Buried defect and interface characterization SEM helps reveal surface morphology, interfaces, particles, and material contrast, while FIB-SEM extends the analysis beneath the surface through precise milling and targeted cross-section preparation. CIQTEK also introduced its electron microscopy solutions, including the SEM5000 Series and DB550 FIB-SEM, for semiconductor failure analysis and advanced materials characterization. Valuable Conversations at Booth #317 Beyond instrument specifications, many discussions focused on real laboratory needs such as sample type, imaging conditions, detector configuration, workflow efficiency, and cross-section quality. These conversations gave our team valuable insight into the challenges faced by semiconductor and failure analysis laboratories in the U.S. Thank you to everyone who visited our booth and shared your applications and ideas with us. We look forward to continuing the conversation and supporting more laboratories with practical electron microscopy solutions for failure analysis and defect characterization.

For structural analysis of complex organic molecules and natural products, 2D homonuclear scalar-correlation NMR experiments are among the most useful tools for resolving ambiguities caused by overlapping signals in 1D spectra. Among the most widely used 1H-1H correlation experiments, COSY and TOCSY answer two different but complementary questions. COSY is mainly used to trace local proton-to-proton connectivity through observable J couplings, while TOCSY extends magnetization transfer through a continuous coupling network and helps identify all observable members of the same spin system. In practical terms, COSY helps answer "Which protons are coupled to each other?", while TOCSY helps answer "Which protons belong to the same spin system?" This article walks through the two experiments from pulse-sequence principles to practical spectrum interpretation, explaining their key differences and how they can be used together in 2D NMR spectroscopy. 1. Core Functions of COSY and TOCSY COSY, or Correlation Spectroscopy, and TOCSY, or Total Correlation Spectroscopy, both use scalar coupling, or J coupling, to provide proton correlation information through chemical bonds. However, the type of structural information they are designed to reveal is different. Consider a continuously coupled proton chain: H1 → H2 → H3 → H4 COSY: Local Coupling Connectivity COSY primarily detects directly observable scalar couplings between pairs of protons. The most common correlations arise from 2JHH and 3JHH couplings, for example: H1 ↔ H2H2 ↔ H3H3 ↔ H4 These pairwise correlations allow researchers to build the local proton connectivity step by step. In other words, a COSY spectrum is particularly useful when the goal is to reconstruct the sequential relationship between neighboring or otherwise detectably coupled protons. Note: COSY correlations are not restricted to two-bond and three-bond couplings. In allylic systems, aromatic systems, or rigid W-type geometries, a sufficiently strong 4J coupling, typically greater than about 1.5 Hz, may also generate a COSY cross peak. Therefore, the presence of a cross peak alone should not be taken as proof that two nuclei are directly adjacent in the molecular structure. TOCSY: Assignment of an Entire Spin System TOCSY takes a different approach. Through magnetization transfer across a J-coupled network, protons within the same continuous spin system can become correlated even when two particular protons do not show a strong direct coupling to each other. Its main purpose is therefore not to determine the direct connectivity of every proton pair. Instead, TOCSY is used to identify and group multiple protons that belong to the same spin system. For example, if H1, H2, H3, and H4 form a continuous coupling network, magnetization can propagate through the sequence: H1 → H2 → H3 → H4 As a result, correlations between more distant members of the system may appear in the TOCSY spectrum. Note: A...