Applications

Aluminum alloys, prized for their exceptional strength-to-weight ratio, are ideal materials for automotive lightweighting. Resistance spot welding (RSW) remains the mainstream joining method for automotive body manufacturing. However, the high thermal and electrical conductivity of aluminum, combined with its surface oxide layer, requires welding currents far exceeding those used for steel. This accelerates copper electrode wear, leading to unstable weld quality, frequent electrode maintenance, and increased production costs. Extending electrode life while ensuring weld quality has become a critical technological bottleneck in the industry.   To address this challenge, Dr. Yang Shanglu's team at Shanghai Institute of Optics and Fine Mechanics conducted an in-depth study using the CIQTEK FESEM SEM5000. They innovatively designed a raised-ring electrode and systematically investigated the effect of ring number (0–4) on electrode morphology, revealing the intrinsic relationship between ring count, crystal defects in the weld nugget, and current distribution. Their results show that increasing the number of raised rings optimizes current distribution, improves thermal input efficiency, enlarges the weld nugget, and significantly extends electrode lifespan. Notably, the raised rings enhance oxide layer penetration, improving current flow while reducing pitting corrosion. This innovative electrode design provides a new technical approach for mitigating electrode wear and lays a theoretical and practical foundation for broader application of aluminum alloy RSW in the automotive industry. The study is published in the Journal of Materials Processing Tech. under the title “Investigating the Influence of Electrode Surface Morphology on Aluminum Alloy Resistance Spot Welding.” Raised-Ring Electrode Design Breakthrough Facing the electrode wear challenge, the team approached the problem from electrode morphology. They machined 0 to 4 concentric raised rings on the end face of conventional spherical electrodes, forming a novel Newton Ring electrode (NTR).   Figure 1. Surface morphology and cross-sectional profile of the electrodes used in the experiment   SEM Analysis Reveals Crystal Defects and Performance Enhancement How do raised rings influence welding performance? Using the CIQTEK FESEM SEM5000 and EBSD techniques, the team characterized the microstructure of weld nuggets in detail. They found that the raised rings pierce the aluminum oxide layer during welding, optimizing current distribution, influencing heat input, and promoting nugget growth. More importantly, the mechanical interaction between raised rings and molten metal significantly increases the density of crystal defects, such as geometrically necessary dislocations (GNDs) and low-angle grain boundaries (LAGBs), within the weld nugget. Optimal performance was observed with three raised rings (NTR3).   Figure 2. EBSD analysis of weld nugget microstruct...

Recently, the 2025 Nobel Prize in Chemistry was awarded to Susumu Kitagawa, Richard Robson, and Omar Yaghi in recognition of “their development of metal–organic frameworks (MOFs).” The three laureates created molecular structures with enormous internal spaces, allowing gases and other chemical species to flow through them. These structures, known as Metal–Organic Frameworks (MOFs), have applications ranging from extracting water from desert air and capturing carbon dioxide, to storing toxic gases and catalyzing chemical reactions. Metal–Organic Frameworks (MOFs) are a class of crystalline porous materials formed by metal ions or clusters linked via organic ligands (Figure 1). Their structures can be envisioned as a three-dimensional network of “metal nodes + organic linkers,” combining the stability of inorganic materials with the design flexibility of organic chemistry. This versatile construction allows MOFs to be composed of almost any metal from the periodic table and a wide variety of ligands, such as carboxylates, imidazolates, or phosphonates, enabling precise control over pore size, polarity, and chemical environment.   Figure 1. Schematic of a Metal–Organic Framework   Since the first permanent-porosity MOFs appeared in the 1990s, thousands of structural frameworks have been developed, including classic examples like HKUST-1 and MIL-101. They exhibit ultrahigh specific surface areas and pore volumes, offering unique properties for gas adsorption, hydrogen storage, separation, catalysis, and even drug delivery. Some flexible MOFs can undergo reversible structural changes in response to adsorption or temperature, showing dynamic behaviors such as “breathing effects.” Thanks to their diversity, tunability, and functionalization, MOFs have become a core topic in porous materials research and provide a solid scientific foundation for studying adsorption performance and characterization methods.   MOFs Characterization The fundamental characterization of MOFs typically includes powder X-ray diffraction (PXRD) patterns to determine crystallinity and phase purity, and nitrogen (N₂) adsorption/desorption isotherms to validate the pore structure and calculate apparent surface area. Other commonly used complementary techniques include: Thermogravimetric Analysis (TGA): Evaluates thermal stability and can estimate pore volume in some cases. Water Stability Tests: Assesses structural stability in water and across different pH conditions. Scanning Electron Microscopy (SEM): Measures crystal size and morphology, and can be combined with energy-dispersive X-ray spectroscopy (EDS) for elemental composition and distribution. Nuclear Magnetic Resonance (NMR) Spectroscopy: Analyzes overall sample purity and can quantify ligand ratios in mixed-ligand MOFs. Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES): Determines sample purity and elemental ratios. Diffuse Reflect...

Recently, a team led by Dr. Wang Haomin from the Shanghai Institute of Microsystem and Information Technology of the Chinese Academy of Sciences made significant progress in studying the magnetism of zigzag graphene nanoribbons (zGNRs) using a CIQTEK Scanning Nitrogen-vacancy Microscope (SNVM).   Building on previous research, the team pre-etched hexagonal boron nitride (hBN) with metal particles to create oriented atomic trenches and used a vapor-phase catalytic chemical vapor deposition (CVD) method to controllably prepare chiral graphene nanoribbons in the trenches, obtaining ~9 nm wide zGNRs samples embedded in the hBN lattice. By combining SNVM and magnetic transport measurements, the team directly confirmed its intrinsic magnetism in experiments. This groundbreaking discovery lays a solid foundation for the development of graphene-based spin electronic devices. The related research findings, titled "Signatures of magnetism in zigzag graphene nanoribbons embedded in a hexagonal boron nitride lattice," have been published in the prestigious academic journal "Nature Materials".     Graphene, as a unique two-dimensional material, exhibits magnetic properties of p-orbital electrons that are fundamentally different from the localized magnetic properties of d/f orbital electrons in traditional magnetic materials, opening up new research directions for exploring pure carbon-based magnetism. Zigzag graphene nanoribbons (zGNRs), potentially possessing unique magnetic electronic states near the Fermi level, are believed to hold great potential in the field of spin electronics devices. However, detecting the magnetism of zGNRs through electrical transport methods faces multiple challenges. For instance, nanoribbons assembled from the bottom up are often too short in length to reliably fabricate devices. Additionally, the high chemical reactivity of zGNR edges can lead to instability or uneven doping. Furthermore, in narrower zGNRs, the strong antiferromagnetic coupling of edge states can make it difficult to detect their magnetic signals electrically. These factors hinder direct detection of the magnetism in zGNRs.   ZGNRs embedded in the hBN lattice exhibit higher edge stability and feature an inherent electric field, creating ideal conditions for detecting the magnetism of zGNRs. In the study, the team used CIQTEK's Room-Temperature SNVM to observe the magnetic signals of zGNRs directly at room temperature.   Figure 1: Magnetic measurement of zGNR embedded in a hexagonal boron nitride lattice using Scanning Nitrogen-vacancy Microscope   In electrical transport measurements, the fabricated approximately 9-nanometer-wide zGNR transistors demonstrated high conductivity and ballistic transport characteristics. Under the influence of a magnetic field, the device exhibited significant anisotropic magnetoresistance, with a magnetoresistance change of approximately 175 Ω at 4 K, a magnetoresistance ratio of about...

Based on the Dual-beam Electron Microscope DB550 independently controlled by CIQTEK, the Transmission Electron Microscope (TEM) nanoscale sample preparation of 28nm process node chips was successfully achieved. TEM verification can analyze the key dimensions of each structure, providing a domestic precision detection solution for semiconductor process defect analysis and yield improvement.  

Metal materials play an indispensable role in modern industry, and their performance directly affects product quality and service life. With the continuous development of materials science, higher requirements have been put forward for the microscopic structure and composition analysis of metal materials. As an advanced characterization tool, Scanning Electron Microscope (SEM) can provide high-resolution surface morphology information and combine with spectroscopic analysis techniques for elemental composition determination, making it an important tool in metal material research. This article aims to discuss the application of SEM technology in the characterization of metal materials and provide references and guidance for related research.   Basic Principles of Scanning Electron Microscope (SEM) The working principle of a scanning electron microscope is based on the interaction between an electron beam and the sample surface. When a high-energy electron beam scans the sample surface, various signals are generated, including secondary electrons, backscattered electrons, characteristic X-rays, etc. These signals are collected by corresponding detectors and processed to form surface morphology images or elemental distribution maps of the sample.   SEM Sample Preparation for Metal Materials   Microstructural Analysis: CIQTEK SEM provides high-resolution images to help researchers observe and analyze the microstructure of metals and composite materials, such as grain size, shape, phase distribution, and defects (e.g., cracks, and inclusions). This is crucial for understanding the relationship between material properties and processing techniques.   α ＋ β Titanium Alloy The heat-affected zone is the most vulnerable area in a welded joint. Studying the changes in the microstructure and properties of the welded area are of great significance for solving welding issues and improving welding quality.   Composition Analysis: Equipped with an EDS or a WDS system, CIQTEK SEM allows for qualitative and quantitative elemental composition analysis. This is highly important for studying the distribution patterns of alloying elements and their impact on material properties.   Elemental Line Analysis by EDS By combining SEM with EDS analysis, the compositional changes and    element distribution of impurities in the welding area can be observed.   Failure Analysis: After failures such as fractures, corrosion, or other forms of damage occur in metals and composite materials, CIQTEK SEM is a key tool for analyzing mechanism failure. By examining fracture surfaces, corrosion products, etc., the root cause of the failure can be identified, providing insights for improving material reliability and lifespan.   2A12 Failure of aluminum alloy components 2A12 aluminum alloy exhibits various precipitation phases, which can be distinguished morphologically as        ...

CIQTEK FIB-SEM Practical Demonstration   Focused Ion Beam Scanning Electron Microscope (FIB-SEM) are essential for various applications such as defect diagnosis, repair, ion implantation, in-situ processing, mask repair, etching, integrated circuit design modification, chip device fabrication, maskless processing, nanostructure fabrication, complex nano-patterning, three-dimensional imaging and analysis of materials, ultra-sensitive surface analysis, surface modification, and transmission electron microscopy specimen preparation.   CIQTEK has introduced the FIB-SEM DB550, which features an independently controllable Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns. It is an elegant and versatile nanoscale analysis and specimen preparation tool that adopts “SuperTunnel” electron optics technology, low aberration, and non-magnetic objective design with low voltage and high-resolution capability to ensure the nano-scale analysis. The ion column facilitates a Ga+ liquid metal ion source with a highly stable, high-quality ion beam to ensure nano-fabrication capability. DB550 has an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and user-friendly GUI software, facilitating an all-in-one nanoscale analysis and fabrication workstation.   To showcase the outstanding performance of the DB550, CIQTEK has planned a special event called "CIQTEK FIB-SEM Practical Demonstration." This program will present videos demonstrating the broad applications of this cutting-edge equipment in fields such as materials science, the semiconductor industry, and biomedical research. Viewers will gain an understanding of the working principles of the DB550, appreciate its stunning microscale images, and explore the significant implications of this technology for scientific research and industrial development.   Nano-Micropillar Specimen Preparation  Nano-micropillar Specimen Preparation has been successfully achieved, demonstrating the powerful capabilities of the CIQTEK Focused Ion Beam Scanning Electron Microscope in nanoscale processing and analysis. The product's performance provides precise, efficient, and multimodal testing support for customers engaged in nanomechanical testing, facilitating breakthroughs in materials research.  

CIQTEK FIB-SEM Practical Demonstration Focused Ion Beam Scanning Electron Microscope (FIB-SEM) are essential for various applications such as defect diagnosis, repair, ion implantation, in-situ processing, mask repair, etching, integrated circuit design modification, chip device fabrication, maskless processing, nanostructure fabrication, complex nano-patterning, three-dimensional imaging and analysis of materials, ultra-sensitive surface analysis, surface modification, and transmission electron microscopy specimen preparation.   CIQTEK has introduced the FIB-SEM DB550, which features an independently controllable Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns. It is an elegant and versatile nanoscale analysis and specimen preparation tool, that adopts “SuperTunnel” electron optics technology, low aberration, and non-magnetic objective design with low voltage and high-resolution capability to ensure the nano-scale analysis. The ion column facilitates a Ga+ liquid metal ion source with a highly stable, high-quality ion beam to ensure nano-fabrication capability. DB550 has an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and user-friendly GUI software, which facilitates an all-in-one nanoscale analysis and fabrication workstation.   To showcase the outstanding performance of the DB550, CIQTEK has planned a special event called "CIQTEK FIB-SEM Practical Demonstration." This program will present videos demonstrating the broad applications of this cutting-edge equipment in fields such as materials science, the semiconductor industry, and biomedical research. Viewers will gain an understanding of the working principles of the DB550, appreciate its stunning microscale images, and explore the significant implications of this technology for scientific research and industrial development.   Preparation of a transmission specimen of Ferrite-martensite steel   The FIB-SEM DB550 developed by CIQTEK possesses the capability to prepare transmission specimens of ferrite-martensite steel flawlessly. This capability enables researchers in the nanoscale domain to directly observe the interface characteristics, microstructural morphology, and evolution process of ferrite and martensite phases. These observations are crucial steps toward deepening the understanding of the relationship between phase transformation kinetics, microstructural organization, and mechanical properties of ferrite-martens steel.

What is the Metal Fracture? When a metal breaks under external forces, it leaves behind two matching surfaces called "fracture surfaces" or "fracture faces." The shape and appearance of these surfaces contain important information about the fracture process.   By observing and studying the morphology of the fracture surface, we can analyze the causes, properties, modes, and mechanisms of the fracture. It also provides insights into the stress conditions and crack propagation rates during the fracture. Similar to an "on-site" investigation, the fracture surface preserves the entire process of fracture. Therefore, examining and analyzing the fracture surface is a crucial step and method in studying metal fractures. Scanning electron microscope, with its large depth of field and high resolution, has been widely used in the field of fracture analysis.   The application of scanning electron microscope in metal fracture analysis   Metal fractures can occur in various failure modes. Based on the deformation level before fracture, they can be classified as brittle fracture, ductile fracture, or a mixture of both. Different fracture modes exhibit characteristic microscopic morphologies, and CIQTEK scanning electron microscope characterization can help researchers quickly analyze fracture surfaces.   Ductile Fracture   Ductile fracture refers to the fracture that occurs after a significant amount of deformation in the component, and its main feature is the occurrence of obvious macroscopic plastic deformation. The macroscopic appearance is cup-cone or shear with a fibrous fracture surface, characterized by dimples. As shown in Figure 1, at the microscale, the fracture surface consists of small cup-shaped micropores called dimples. Dimples are microvoids formed by localized plastic deformation in the material. They nucleate, grow, and coalesce, eventually leading to fracture, and leaving traces on the fracture surface.   Figure 1: Ductile fracture surface of metal / 10kV / Inlens   Brittle Fracture   Brittle fracture refers to a fracture that occurs without significant plastic deformation in the component. The material undergoes little or no plastic deformation before fracture. Macroscopically, it appears crystalline, and microscopically, it can exhibit intergranular fracture, cleavage fracture, or quasi-cleavage fracture. As shown in Figure 2, it is a mixed brittle-ductile fracture surface of metal. In the ductile fracture region, noticeable dimples can be observed. In the brittle fracture region, intergranular brittle fracture occurs along different crystallographic orientations. At the microscale, the fracture surface exhibits multiple facets of the grains, with clear grain boundaries and a three-dimensional appearance. Smooth and featureless morphology is often observed on the grain boundaries. When the grains are coarse, the fracture surface appears crystalline, also known as a crystalline fracture; when the...