To support the deployment, CIQTEK’s engineering team provided comprehensive on-site training to the JH Technologies team. This included detailed system operation, application demonstrations, and technical discussions tailored to real-world use cases. The collaboration enhanced the JH team’s capabilities in showcasing and supporting CIQTEK instruments.
Following the delivery, JH Technologies hosted a successful Open House at its Fremont facility, featuring live demonstrations of both systems. The event attracted strong attendance from academic and industry professionals, generating significant interest and positive feedback. Encouraged by the success, JH Technologies plans to organize more Open House events shortly to promote CIQTEK’s advanced imaging solutions further.
Proven Imaging Technology for Demanding Applications
The SEM3300 combines a traditional tungsten filament source with modern optics, offering high-resolution performance at low accelerating voltages. It provides a powerful yet accessible solution for routine analysis and research.
The SEM5000X delivers ultra-high resolution imaging and advanced automation features, making it ideal for materials science, semiconductor inspection, and nanotechnology research. Both systems offer intuitive user interfaces and flexible configuration options to meet diverse application needs.
Looking Ahead
CIQTEK’s collaboration with JH Technologies reflects a shared vision of delivering world-class SEM instruments supported by strong local expertise. By combining performance, usability, and accessibility, CIQTEK is rapidly gaining traction among U.S. users in research, manufacturing, and education.
Aleks Zhang, Deputy Director of Overseas Business Group at CIQTEK, commented, “We are proud to see our SEM instruments in the hands of such a professional and capable partner. The momentum in the U.S. market is strong, and we are committed to deepening our support for local customers through close cooperation with distributors like JH Technologies.”
High-speed Fully Automated Field Emission Scanning Electron Microscope Workstation CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. Its imaging speed is over five times faster than that of a conventional field emission scanning electron microscope (FESEM).
Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM) The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.
Ultra High-Resolution Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.