News & Events

CIQTEK has achieved a global milestone by completing the world’s first EPR spectrometer modernization project at Queen Mary University of London. The successful upgrade demonstrates CIQTEK’s strong technical expertise and dedication to providing efficient, high-quality services for researchers worldwide. The project took place at Queen Mary University of London, within the School of Physical and Chemical Sciences, where the EPR research group had long relied on an aging EPR spectrometer. Over time, their system could no longer meet the demands of advanced magnetic resonance studies. Facing this challenge, the team sought a reliable and effective way to enhance their EPR capabilities without fully replacing their existing instrument.   Upon learning about CIQTEK’s comprehensive and industry-leading EPR modernization service, and after in-depth communication with the CIQTEK EPR team, the researchers identified the perfect solution. CIQTEK’s modernization approach provides a cost-effective path to extend the lifetime of existing EPR instruments while significantly improving performance through upgraded hardware, optimized control systems, and advanced functionalities such as continuous-wave (CW) EPR.   EPR Team Preparing the Shipment   In October 2025, CIQTEK’s installation and training engineers delivered a seamless, full-cycle service from shipping and on-site setup to professional user training. The modernization was completed efficiently, enabling the Queen Mary University EPR group to continue their research with a renewed and high-performance system.   CIQTEK and Queen Mary University EPR Teams   Dr. Liu, a member of this EPR research team at Queen Mary University, shared his feedback after the completion of the project: “This collaboration has far exceeded our expectations. The service efficiency was excellent, the training was thorough and well organized, and we are very satisfied with the test results. We look forward to working with CIQTEK again in the future.” His comments perfectly reflect CIQTEK’s service principles: “Quality Service. Trusted Partner.”     We would also like to express our sincere gratitude to our UK partner, SciMed, for their valuable local support and coordination throughout the project. Their collaboration ensured smooth communication and timely progress at every stage.   About CIQTEK EPR Modernization Service CIQTEK EPR Modernization & Upgrade Service gives existing EPR users a second life for their instruments. By replacing outdated control and detection modules with CIQTEK’s state-of-the-art technology, researchers can enjoy enhanced stability, sensitivity, and user experience comparable to new-generation spectrometers while keeping their original system platform. The service supports both continuous-wave and pulse EPR configurations and is compatible with a wide range of legacy models. Learn more about th...

CIQTEK has taken another important step forward in Europe with the installation of the SEM4000Pro Field Emission Scanning Electron Microscope (FE-SEM) at the SYNERGIE4 demonstration showroom in France. The new setup allows researchers and industrial users in Europe to experience high-resolution imaging, analytical performance, and ease of operation offered by the CIQTEK SEM4000Pro. The system provides outstanding image quality for fine microstructural observation and supports a wide range of applications in materials science, microelectronics, and R&D.     SYNERGIE4 is CIQTEK's French distributor and service provider for advanced microscopy and microanalysis solutions. With extensive experience in electron microscopy and analytical instruments, SYNERGIE4 supports universities, research institutes, and industrial labs across France with tailored solutions, technical expertise, and training. Now, SYNERGIE4’s demo center features a fully operational CIQTEK SEM4000Pro, offering hands-on demonstrations for visitors to explore its imaging capabilities, intuitive software interface, and versatility across various research fields.   “Having the CIQTEK SEM4000Pro available in our showroom allows us to showcase its imaging performance directly to our customers,” said a representative from SYNERGIE4. “It’s a great addition to our demonstration facilities and an important step in expanding our microscopy portfolio.”   With the SEM4000Pro now available in France, European users can directly evaluate its performance, supported by SYNERGIE4’s local expertise and technical demonstration services. This collaboration marks a significant milestone in CIQTEK’s ongoing effort to enhance accessibility to advanced electron microscopy technologies across Europe.

As semiconductor manufacturing advances to finer process nodes, wafer-level defect analysis, failure location, and micro-nano fabrication have become key to improving yield. CIQTEK introduces the 8-inch Wafer Dual-Beam Full-Size Processing Solution, combining high-resolution imaging and precise ion beam processing to achieve "observation-analysis-cutting" across the entire wafer, providing strong technical support for advanced semiconductor processes.   This solution features a 150mm long-stroke high-precision sample stage, enabling full-wafer, non-destructive observation and processing of 8-inch wafers. With an external optical navigation system and intelligent anti-collision algorithms, it ensures rapid and precise wafer positioning and safe operation. The system is equipped with a Schottky field emission electron gun, offering a resolution of 0.9 nm @ 15kV, and an ion beam resolution of 3 nm @ 30kV, capable of defect detection, cross-section slicing, and micro-structure fabrication at the nanoscale.   Core Advantages: 150mm Travel Stage: Combines long travel with high precision for an extensive observation range. Excellent compatibility with different-sized fixtures. Robust structure ensures wafer stability and quick, reliable loading. 8-inch Quick Exchange: Intelligent weight-bearing design with a sliding base for stability and durability. Full-size compatibility: Supports 2/4/6/8-inch wafers. Fast sample exchange: Vacuum pumping and sample loading within one minute. Software and Anti-Collision: Fully automatic intelligent navigation with accurate movement and positioning. Multi-axis coordinated motion for full-wafer observation. Smart anti-collision: Trajectory simulation and algorithmic spatial calculations to avoid risks. Multiple real-time monitoring: Real-time multi-angle monitoring of wafer position. External Optical Navigation: Ultra-stable structure design suppresses image shake. High-definition imaging with a precise field of view for full-wafer display. Professional anti-glare lighting reduces wafer surface reflection.   Wafer observation range   CIQTEK Dual-Beam Electron Microscope Solution combines outstanding hardware with intelligent software systems, enabling efficient defect detection and process optimization through one-click brightness and contrast adjustment, auto-focus, and multi-format image output, empowering users to complete the full chain of tasks from defect discovery to process optimization.

In life sciences, achieving high-precision and large-scale 3D structural and dynamic analysis of biological samples such as cells and tissues has become key to breaking through research bottlenecks. CIQTEK has introduced a multi-technology-route Volumetric Electron Microscopy (VEM) solution, integrating SS-SEM, SBF-SEM, and FIB-SEM. This provides an all-around, high-performance, and intelligent platform for biological 3D reconstruction, helping researchers uncover the micro-level mysteries of life.   Three Advanced Technical Routes 01. SS-SEM High-Speed ImagingBy combining external serial sectioning with the CIQTEK high-speed HEM6000-Bio SEM, this solution enables rapid imaging and automated acquisition of large-volume samples. Data acquisition efficiency is more than 5× higher than conventional SEM, supporting 24/7 unattended high-throughput operation.   02. SBF-SEM In-Situ SectioningBased on the CIQTEK ultra-high-resolution SEM5000X with an integrated microtome, this approach achieves in-situ sectioning and imaging cycles. It offers simple operation, high automation, and effectively avoids surface contamination.   03. FIB-SEM High-Precision AnalysisLeveraging focused ion beam–electron beam dual-beam systems, this route delivers nanoscale Z-axis resolution to analyze fine structures such as organelles and membranes. It enables in-situ 3D reconstruction without physical slicing.   Intelligent Integration & Broad Applications The CIQTEK VEM solution deeply integrates AI algorithms and a multilingual software platform, supporting a full workflow from data acquisition, image alignment, and segmentation to 3D visualization. Compatible with mainstream reconstruction software, it significantly lowers the learning curve.   Application cases span neuroscience, cell biology, and pathogenic microbiology, offering a powerful tool for advancing life science research.

Research on the microscopic behavior of materials is entering a new era of multi-scenario coupling and in-situ dynamic characterization. CIQTEK has launched an innovative In-situ Mechanical Testing Solution, designed with outstanding openness and compatibility. It enables seamless integration of CIQTEK’s full range of electron microscopes with mainstream in-situ testing devices, providing a flexible and efficient platform for coupled analysis in diverse research scenarios.   Breaking the limitations of closed systems, the solution integrates all critical elements required for in-situ EM adaptability, featuring: High beam current: >100 nA, ideal for fast EDS/EBSD analysis Large space: 360 × 310 × 288 mm (L × W × H) High load capacity: 5 kg (up to 10 kg with custom fixtures) Multi-view CCDs: ensuring system safety during in-situ operation Multiple interfaces: supporting customized flange accessories Pre-acceptance: full accessory debugging before delivery, ensuring complete functionality without on-site installation issues The solution can be configured across CIQTEK’s full range of electron microscopy products, including CIQTEK SEM3200, SEM5000X, DB550 dual-beam systems, and more. It also offers seamless compatibility with tensile stages, heating stages, nanoindenters, and electrochemical workstations from world-leading suppliers. This open architecture enables researchers to flexibly combine the most suitable equipment, maximizing experimental performance.   CIQTEK’s in-situ stage solution supported customers in publishing a high-impact paper (DOI: 10.1126/science.adq6807).   CIQTEK’s In-situ Mechanical Solution also supports multi-field coupling (mechanical, thermal, electrochemical), enabling nanoscale real-time observation of materials under complex environments. By synchronizing high-resolution imaging with in-situ signals, researchers can capture critical phenomena such as crack propagation, phase transitions, and interfacial reactions with precision. With a temperature range of -170 to 1200 °C, advanced load control, and rapid response systems, it accurately simulates service conditions of materials across various industries. Combined with EBSD and EDS, it provides comprehensive datasets for understanding material behavior under coupled stimuli.   Successfully applied in aerospace materials, new energy devices, and biomedical materials, this solution demonstrates CIQTEK’s exceptional compatibility and scalability in advanced electron microscopy platforms.

Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most cutting-edge directions in electron microscopy. By performing a two-dimensional scan across the sample surface while recording a full diffraction pattern at each scan point with a pixelated detector, 4D-STEM generates a four-dimensional dataset containing both real-space and reciprocal-space information. This technique breaks through the limitations of conventional electron microscopy that typically collects only a single scattering signal. Instead, it captures and analyzes the entire spectrum of electron–sample interactions. With 4D-STEM, researchers can achieve multiple advanced functionalities within a single experiment, including virtual imaging, crystal orientation and strain mapping, electric and magnetic field distribution analysis (differential phase contrast), and even atomic-resolution reconstruction through diffraction stacking. It greatly expands the dimensionality and depth of materials characterization, offering an unprecedented tool for nanoscience and materials research.   At the Chinese National Conference on Electron Microscopy 2025 (Sept 26–30, Wuhan), CIQTEK releases its 4D-STEM solution, designed to break through the boundaries of traditional imaging and deliver data with unmatched dimensionality and analytical power.   System Workflow   The CIQTEK 4D-STEM solution features high spatial resolution, multi-dimensional analysis, low-dose operation to minimize beam damage, and flexible data processing, providing researchers with reliable and outstanding methods for advanced materials analysis.

In the fields of high-temperature material performance research and phase transition mechanism analysis, traditional external heating methods often fail to combine precise micro-region temperature control with real-time observation.   CIQTEK, in collaboration with the Micro-Nano Center of the University of Science and Technology of China, has developed an innovative in-situ heating chip solution. By integrating MEMS heating chips with dual-beam electron microscopes, this solution enables precise temperature control (from room temperature to 1100°C) and micro-dynamic analysis of samples, offering a new tool for studying material behavior in high-temperature environments. This solution uses the CIQTEK dual-beam SEM and specialized MEMS heating chips, with temperature control accuracy better than 0.1°C and temperature resolution better than 0.1°C. The system also features excellent temperature uniformity and low infrared radiation, ensuring stable analysis at high temperatures. The system supports various characterization techniques during heating, including micro-region morphology observation, EBSD crystal orientation analysis, and EDS composition analysis. This allows for a comprehensive understanding of phase transitions, stress evolution, and composition migration under thermal effects.   The system operates without breaking the vacuum, fulfilling the full process requirements for sample preparation and characterization (in-situ micro-region EBSD).   The integrated workflow design covers the entire process, from sample preparation (ion beam processing, nano-manipulator extraction) to in-situ welding and heating tests. The system supports multi-angle operation, featuring a 45° heating chip and a 36° copper grid position, which meet the complex experimental needs. The system has been successfully applied in high-temperature performance research of alloys, ceramics, and semiconductors, helping users gain deeper insights into material responses in real-world environments.     September 26–30, Wuhan | 2025 Chinese National Conference on Electron MicroscopyCIQTEK's eight major electron microscopy solutions will be showcased!

CIQTEK has introduced its next-generation 12-inch wafer scanning electron microscope (SEM) solution, designed to meet the demands of advanced semiconductor manufacturing processes. Offering full-wafer inspection without the need for rotation or tilting, this innovative solution ensures high-resolution, non-destructive analysis to support critical process development. Equipped with an ultra-large travel stage (X/Y ≥ 300 mm), the system provides complete coverage of 12-inch wafers, eliminating the need for sample cutting or transfer. This ensures true "original size, original position" observation. With a Schottky field emission electron gun, it achieves a resolution of 1.0 nm at 15 kV and 1.5 nm at 1 kV, minimizing electron beam damage, making it ideal for sensitive materials and structures.     Key features include: Ultra-large travel stage (X/Y > 300 mm) for full-wafer inspection High-resolution imaging: 1.0 nm at 15 kV and 1.5 nm at 1 kV Automated loading and optical navigation system for fast wafer exchange and precise positioning Intelligent software for auto-focus, astigmatism correction, and multi-format image output   CIQTEK's 12-inch wafer inspection SEM is more than just an observation tool; it's a critical instrument driving higher yields and smaller nodes in semiconductor manufacturing.   September 26–30, WuhanCIQTEK will unveil eight cutting-edge electron microscopy solutions at the 2025 Chinese National Conference on Electron Microscopy!