CIQTEK SEM Microscopes Customer Stories

Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope   The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities.   The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.

High-speed Fully Automated Field Emission Scanning Electron Microscope Workstation   CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. Its imaging speed is over five times faster than that of a conventional field emission scanning electron microscope (FESEM).

Analytical Schottky Field Emission Scanning Electron Microscopy (FESEM)   The SEM5000XLV combines high-resolution imaging with high-current analytical capability and supports rapid switching between low-vacuum and high-current operating modes. It supports integration with optional EDS and EBSD modules, providing efficient characterization of challenging specimens and a comprehensive solution for localized microstructural and compositional analysis.     Contact our U.S. team: info.usa@ciqtek.com

Ultra-High Resolution Schottky  Field Emission Scanning Electron Microscope The SEM5000Pro (G2) field-emission scanning electron microscope is designed for stability, reliability, ease of use, and productivity, bringing field-emission imaging capabilities to a wide range of laboratories. Combining ultra-high spatial resolution with long-term operating stability, it consistently delivers high-quality images for applications ranging from advanced nanomaterials characterization to semiconductor R&D and manufacturing, meeting the demanding needs of research institutions and industrial quality-control laboratories.  

Analytical Schottky Field Emission Scanning Electron Microscope (FESEM)   CIQTEK SEM4000Pro is an analytical FE-SEM model equipped with a high-brightness and long-life Schottky field emission electron gun. Its three-stage electromagnetic lens design offers significant advantages in analytical applications such as EDS / EDX, EBSD, WDS, and more. The model comes standard with a low-vacuum mode and a high-performance low-vacuum secondary electron detector, as well as a retractable backscattered electron detector, which benefits the observation of poorly conductive or non-conductive specimens.   Contact our U.S. team: info.usa@ciqtek.com

High-Performance and Universal Tungsten Filament SEM Microscope   The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expandability.   Contact our U.S. team: info.usa@ciqtek.com