CIQTEK Cryo-SEM Solution Enables Damage-Free, High-Resolution Imaging of Biological Samples
CIQTEK Cryo-SEM Solution Enables Damage-Free, High-Resolution Imaging of Biological Samples
September 18, 2025
In the fields of life sciences, biomedicine, food inspection, and soft matter research, achieving high-resolution imaging of hydrated and beam-sensitive samples has always been a major challenge. Conventional sample preparation methods, such as chemical fixation, dehydration, and drying, often result in shrinkage, deformation, or structural damage, leading to results that deviate from the true state of the sample.
Leveraging its advanced scanning electron microscopy technology, CIQTEK has introduced the Cryo-SEM Solution, which integrates low-temperature freezing and vacuum transfer. This enables in-situ, non-destructive, and high-fidelity microscopic observation of biological and sensitive samples, truly “freezing” the microscopic details of life.
With liquid-nitrogen slush rapid-freezing technology, samples can be vitrified instantly at -210 °C, preserving their original morphology and chemical composition to the greatest extent. The integrated cryo-preparation system combines freeze-fracture, sublimation coating, and low-temperature transfer, avoiding the complexity and potential errors of conventional manual preparation. Throughout the entire process, samples are maintained under cryogenic vacuum conditions and transferred to the SEM cryo-stage, where high-resolution imaging at -180 °C effectively suppresses electron beam damage and significantly improves image quality.
Cryo-prepared boxwood leaf showing intact vein structures, while the untreated sample exhibits severe shrinkage.
Yogurt
Mold
Cryo-prepared yogurt sample clearly reveals protein networks and fungal hyphae.
The CIQTEK Cryo-SEM Solution is more than just a set of instruments. It embodies a scientific approach dedicated to faithfully restoring the microscopic world. It empowers researchers to overcome technical limitations, capture critical details at the micro scale of life, and drive both fundamental research and applied development to new heights.
September 26–30, Wuhan
At the 2025 Chinese National Electron Microscopy Academic Conference, CIQTEK will unveil eight cutting-edge EM solutions.
Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM) The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.
Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.
Ultra High-Resolution Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.