The DB550 combines high-resolution imaging with precise ion beam milling, enabling researchers to perform 3D reconstruction, cross-sectional analysis, and nanoscale material modification with efficiency and accuracy. With these capabilities, the system opens new possibilities for semiconductor analysis, materials science, and life science research.
Following installation, CIQTEK engineers provided hands-on training to the GSEM team, covering both standard workflows and advanced applications. The interactive sessions ensured that users gained practical experience in operating the instrument, from sample preparation to high-resolution imaging and data analysis. The enthusiasm and engagement of the GSEM team highlighted the strong potential for the DB550 to support diverse research projects at the center.
This collaboration reflects CIQTEK’s commitment to working closely with partners worldwide. By equipping GSEM’s facility with the DB550, we are not only strengthening our presence in the Korean market but also helping local researchers gain access to cutting-edge tools for scientific innovation.
We look forward to seeing the exciting results that GSEM’s Electron Microscope Center will achieve with the DB550, and we remain committed to providing ongoing technical support and collaboration.
Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.