News & Events

CIQTEK continues to expand its presence in Europe with the establishment of an SEM demo station in Spain, operated by the trusted local distributor IESMAT. Located in Madrid, the demo station features a CIQTEK High-Performance and Universal Tungsten Filament SEM Microscope SEM3200, providing Spanish users with convenient access to live demonstrations, sample testing, and hands-on operation. The facility also offers professional Spanish-language service and technical consultation, helping local customers better understand and apply CIQTEK’s advanced electron microscopy technologies.   Since the installation of the CIQTEK SEM3200, IESMAT has actively organized a series of seminars and workshops throughout 2025, typically held every one to two months. These events welcome researchers and professionals from academia and industry to explore the performance and advantages of CIQTEK scanning electron microscopes through hands-on sessions and interactive learning experiences.   IESMAT SEM Workshop in January 2025   IESMAT SEM Seminar in Feb, 2025   IESMAT Most Recent SEM Seminar in Sep, 2025   The next event, IESMAT Electron Microscopy Day II, will take place on November 6, 2025, in Madrid. Participants will enjoy: Live hands-on electron microscopy with the CIQTEK SEM3200 Cutting-edge analytics using EDS and EBSD Insights into current trends and future directions of electron microscopy in Spain   The SEM demo station at IESMAT marks an important milestone in CIQTEK’s European development strategy. It enhances local accessibility to advanced electron microscopy technologies and provides researchers with authentic, real-world experience. Through close collaboration with partners like IESMAT, CIQTEK is deepening its engagement with the European market, promoting innovation, and building stronger connections with the scientific community.   CIQTEK remains committed to empowering global users through advanced instrumentation, localized service, and continuous collaboration for scientific progress.

This week, CIQTEK was pleased to welcome the team from our Korean distributor GSEM to the CIQTEK Electron Microscope Factory in Wuxi, China. The visit included members from sales, application, and service departments, who participated in a series of intensive and professional training sessions focused on electron microscope operation and maintenance. The CIQTEK Electron Microscope Factory serves as the company’s dedicated manufacturing and training center for electron microscopy systems. Equipped with advanced production facilities, precision assembly lines, and demonstration laboratories, the factory integrates R&D, manufacturing, quality control, and user training to ensure high performance and reliability across CIQTEK SEM, FIB-SEM, and TEM product lines.     The training was hosted by Mr. Gao, Head of the Electron Microscopy Solutions Department at CIQTEK, together with senior engineers from the CIQTEK electron microscopy team. During the program, participants received systematic instruction on key procedures such as ion pump baking, aperture position inspection, filament centering, high-resolution imaging practice, and accessory installation and calibration. Throughout the week, the GSEM team worked closely with CIQTEK engineers to gain both theoretical and practical understanding of CIQTEK’s electron microscopy technology. The sessions were designed to ensure that GSEM’s sales and service engineers are fully equipped with the technical expertise required to support local customers in Korea, from system installation and operation to advanced troubleshooting and maintenance.     This training not only enhanced GSEM’s technical capabilities but also strengthened the partnership between CIQTEK and GSEM. With continuous collaboration in product knowledge, application support, and customer service, CIQTEK and GSEM will jointly provide more professional, efficient, and reliable solutions to the Korean electron microscopy market. CIQTEK remains committed to empowering global partners through professional training, technical collaboration, and continuous innovation in scientific instrumentation.

CIQTEK has achieved a global milestone by completing the world's first EPR spectrometer modernization and upgrade project at Queen Mary University of London, UK. The successful upgrade demonstrates CIQTEK's strong technical expertise and dedication to providing efficient, high-quality services for researchers worldwide.   The Upgraded X-Band CW EPR Spectrometer at Queen Mary University of London, UK The project took place at Queen Mary University of London, within the School of Physical and Chemical Sciences, where the EPR research group had long relied on an aging floor stand EPR spectrometer. Over time, their system could no longer meet the demands of advanced magnetic resonance studies. Facing this challenge, the team sought a reliable and effective way to enhance their EPR capabilities without fully replacing their existing instrument.   Upon learning about CIQTEK’s comprehensive and industry-leading EPR modernization and upgrade service, and after in-depth communication with the CIQTEK EPR team, the researchers identified the perfect solution. CIQTEK's modernization approach provides a cost-effective path to extend the lifetime of existing EPR instruments while significantly improving performance through upgraded hardware, optimized control systems, and advanced functionalities such as continuous-wave (CW) EPR.   CIQTEK EPR Team Preparing the Shipment   In October 2025, CIQTEK's installation and training engineers delivered a seamless, full-cycle service from shipping and on-site setup to professional user training. The modernization was completed efficiently, enabling the Queen Mary University EPR group to continue their research with a renewed and high-performance X-band EPR system.   CIQTEK and Queen Mary University EPR Teams at Queen Mary University of London, UK   Dr. Liu, a member of this EPR research team at Queen Mary University, shared his feedback after the completion of the project: “This collaboration has far exceeded our expectations. The service efficiency was excellent, the training was thorough and well organized, and we are very satisfied with the test results. We look forward to working with CIQTEK again in the future.” His comments perfectly reflect CIQTEK's service principles: “Quality Service. Trusted Partner.”   Researchers are testing the upgraded EPR system at Queen Mary University of London, UK   We would also like to express our sincere gratitude to our UK partner, SciMed, for their valuable local support and coordination throughout the project. Their collaboration ensured smooth communication and timely progress at every stage.   About CIQTEK EPR Modernization and Upgrade Service CIQTEK EPR Modernization & Upgrade Service gives existing EPR users a second life for their instruments. By replacing outdated control and detection modules with CIQTEK's state-of-the-art technology, researchers can enjoy enhanced stability, sensitivity, an...

CIQTEK has taken another important step forward in Europe with the installation of the SEM4000Pro Field Emission Scanning Electron Microscope (FE-SEM) at the SYNERGIE4 demonstration showroom in France. The new setup allows researchers and industrial users in Europe to experience high-resolution imaging, analytical performance, and ease of operation offered by the CIQTEK SEM4000Pro. The system provides outstanding image quality for fine microstructural observation and supports a wide range of applications in materials science, microelectronics, and R&D.     SYNERGIE4 is CIQTEK's French distributor and service provider for advanced microscopy and microanalysis solutions. With extensive experience in electron microscopy and analytical instruments, SYNERGIE4 supports universities, research institutes, and industrial labs across France with tailored solutions, technical expertise, and training. Now, SYNERGIE4’s demo center features a fully operational CIQTEK SEM4000Pro, offering hands-on demonstrations for visitors to explore its imaging capabilities, intuitive software interface, and versatility across various research fields.   “Having the CIQTEK SEM4000Pro available in our showroom allows us to showcase its imaging performance directly to our customers,” said a representative from SYNERGIE4. “It’s a great addition to our demonstration facilities and an important step in expanding our microscopy portfolio.”   With the SEM4000Pro now available in France, European users can directly evaluate its performance, supported by SYNERGIE4’s local expertise and technical demonstration services. This collaboration marks a significant milestone in CIQTEK’s ongoing effort to enhance accessibility to advanced electron microscopy technologies across Europe.

As semiconductor manufacturing advances to finer process nodes, wafer-level defect analysis, failure location, and micro-nano fabrication have become key to improving yield. CIQTEK introduces the 8-inch Wafer Dual-Beam Full-Size Processing Solution, combining high-resolution imaging and precise ion beam processing to achieve "observation-analysis-cutting" across the entire wafer, providing strong technical support for advanced semiconductor processes.   This solution features a 150mm long-stroke high-precision sample stage, enabling full-wafer, non-destructive observation and processing of 8-inch wafers. With an external optical navigation system and intelligent anti-collision algorithms, it ensures rapid and precise wafer positioning and safe operation. The system is equipped with a Schottky field emission electron gun, offering a resolution of 0.9 nm @ 15kV, and an ion beam resolution of 3 nm @ 30kV, capable of defect detection, cross-section slicing, and micro-structure fabrication at the nanoscale.   Core Advantages: 150mm Travel Stage: Combines long travel with high precision for an extensive observation range. Excellent compatibility with different-sized fixtures. Robust structure ensures wafer stability and quick, reliable loading. 8-inch Quick Exchange: Intelligent weight-bearing design with a sliding base for stability and durability. Full-size compatibility: Supports 2/4/6/8-inch wafers. Fast sample exchange: Vacuum pumping and sample loading within one minute. Software and Anti-Collision: Fully automatic intelligent navigation with accurate movement and positioning. Multi-axis coordinated motion for full-wafer observation. Smart anti-collision: Trajectory simulation and algorithmic spatial calculations to avoid risks. Multiple real-time monitoring: Real-time multi-angle monitoring of wafer position. External Optical Navigation: Ultra-stable structure design suppresses image shake. High-definition imaging with a precise field of view for full-wafer display. Professional anti-glare lighting reduces wafer surface reflection.   Wafer observation range   CIQTEK Dual-Beam Electron Microscope Solution combines outstanding hardware with intelligent software systems, enabling efficient defect detection and process optimization through one-click brightness and contrast adjustment, auto-focus, and multi-format image output, empowering users to complete the full chain of tasks from defect discovery to process optimization.

In life sciences, achieving high-precision and large-scale 3D structural and dynamic analysis of biological samples such as cells and tissues has become key to breaking through research bottlenecks. CIQTEK has introduced a multi-technology-route Volumetric Electron Microscopy (VEM) solution, integrating SS-SEM, SBF-SEM, and FIB-SEM. This provides an all-around, high-performance, and intelligent platform for biological 3D reconstruction, helping researchers uncover the micro-level mysteries of life.   Three Advanced Technical Routes 01. SS-SEM High-Speed ImagingBy combining external serial sectioning with the CIQTEK high-speed HEM6000-Bio SEM, this solution enables rapid imaging and automated acquisition of large-volume samples. Data acquisition efficiency is more than 5× higher than conventional SEM, supporting 24/7 unattended high-throughput operation.   02. SBF-SEM In-Situ SectioningBased on the CIQTEK ultra-high-resolution SEM5000X with an integrated microtome, this approach achieves in-situ sectioning and imaging cycles. It offers simple operation, high automation, and effectively avoids surface contamination.   03. FIB-SEM High-Precision AnalysisLeveraging focused ion beam–electron beam dual-beam systems, this route delivers nanoscale Z-axis resolution to analyze fine structures such as organelles and membranes. It enables in-situ 3D reconstruction without physical slicing.   Intelligent Integration & Broad Applications The CIQTEK VEM solution deeply integrates AI algorithms and a multilingual software platform, supporting a full workflow from data acquisition, image alignment, and segmentation to 3D visualization. Compatible with mainstream reconstruction software, it significantly lowers the learning curve.   Application cases span neuroscience, cell biology, and pathogenic microbiology, offering a powerful tool for advancing life science research.

Research on the microscopic behavior of materials is entering a new era of multi-scenario coupling and in-situ dynamic characterization. CIQTEK has launched an innovative In-situ Mechanical Testing Solution, designed with outstanding openness and compatibility. It enables seamless integration of CIQTEK’s full range of electron microscopes with mainstream in-situ testing devices, providing a flexible and efficient platform for coupled analysis in diverse research scenarios.   Breaking the limitations of closed systems, the solution integrates all critical elements required for in-situ EM adaptability, featuring: High beam current: >100 nA, ideal for fast EDS/EBSD analysis Large space: 360 × 310 × 288 mm (L × W × H) High load capacity: 5 kg (up to 10 kg with custom fixtures) Multi-view CCDs: ensuring system safety during in-situ operation Multiple interfaces: supporting customized flange accessories Pre-acceptance: full accessory debugging before delivery, ensuring complete functionality without on-site installation issues The solution can be configured across CIQTEK’s full range of electron microscopy products, including CIQTEK SEM3200, SEM5000X, DB550 dual-beam systems, and more. It also offers seamless compatibility with tensile stages, heating stages, nanoindenters, and electrochemical workstations from world-leading suppliers. This open architecture enables researchers to flexibly combine the most suitable equipment, maximizing experimental performance.   CIQTEK’s in-situ stage solution supported customers in publishing a high-impact paper (DOI: 10.1126/science.adq6807).   CIQTEK’s In-situ Mechanical Solution also supports multi-field coupling (mechanical, thermal, electrochemical), enabling nanoscale real-time observation of materials under complex environments. By synchronizing high-resolution imaging with in-situ signals, researchers can capture critical phenomena such as crack propagation, phase transitions, and interfacial reactions with precision. With a temperature range of -170 to 1200 °C, advanced load control, and rapid response systems, it accurately simulates service conditions of materials across various industries. Combined with EBSD and EDS, it provides comprehensive datasets for understanding material behavior under coupled stimuli.   Successfully applied in aerospace materials, new energy devices, and biomedical materials, this solution demonstrates CIQTEK’s exceptional compatibility and scalability in advanced electron microscopy platforms.

Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most cutting-edge directions in electron microscopy. By performing a two-dimensional scan across the sample surface while recording a full diffraction pattern at each scan point with a pixelated detector, 4D-STEM generates a four-dimensional dataset containing both real-space and reciprocal-space information. This technique breaks through the limitations of conventional electron microscopy that typically collects only a single scattering signal. Instead, it captures and analyzes the entire spectrum of electron–sample interactions. With 4D-STEM, researchers can achieve multiple advanced functionalities within a single experiment, including virtual imaging, crystal orientation and strain mapping, electric and magnetic field distribution analysis (differential phase contrast), and even atomic-resolution reconstruction through diffraction stacking. It greatly expands the dimensionality and depth of materials characterization, offering an unprecedented tool for nanoscience and materials research.   At the Chinese National Conference on Electron Microscopy 2025 (Sept 26–30, Wuhan), CIQTEK releases its 4D-STEM solution, designed to break through the boundaries of traditional imaging and deliver data with unmatched dimensionality and analytical power.   System Workflow   The CIQTEK 4D-STEM solution features high spatial resolution, multi-dimensional analysis, low-dose operation to minimize beam damage, and flexible data processing, providing researchers with reliable and outstanding methods for advanced materials analysis.