CIQTEK Strengthens Its Presence in Spain with the SEM Demo Station at IESMAT
CIQTEK Strengthens Its Presence in Spain with the SEM Demo Station at IESMAT
October 27, 2025
CIQTEK continues to expand its presence in Europe with the establishment of an SEM demo station in Spain, operated by the trusted local distributor IESMAT. Located in Madrid, the demo station features a CIQTEK High-Performance and Universal Tungsten Filament SEM Microscope SEM3200, providing Spanish users with convenient access to live demonstrations, sample testing, and hands-on operation. The facility also offers professional Spanish-language service and technical consultation, helping local customers better understand and apply CIQTEK’s advanced electron microscopy technologies.
Since the installation of the CIQTEK SEM3200, IESMAT has actively organized a series of seminars and workshops throughout 2025, typically held every one to two months. These events welcome researchers and professionals from academia and industry to explore the performance and advantages of CIQTEK scanning electron microscopes through hands-on sessions and interactive learning experiences.
IESMAT SEM Workshop in January 2025
IESMAT SEM Seminar in Feb, 2025
IESMAT Most Recent SEM Seminar in Sep, 2025
The next event, IESMAT Electron Microscopy Day II, will take place on November 6, 2025, in Madrid. Participants will enjoy:
Live hands-on electron microscopy with the CIQTEK SEM3200
Cutting-edge analytics using EDS and EBSD
Insights into current trends and future directions of electron microscopy in Spain
The SEM demo station at IESMAT marks an important milestone in CIQTEK’s European development strategy. It enhances local accessibility to advanced electron microscopy technologies and provides researchers with authentic, real-world experience. Through close collaboration with partners like IESMAT, CIQTEK is deepening its engagement with the European market, promoting innovation, and building stronger connections with the scientific community.
CIQTEK remains committed to empowering global users through advanced instrumentation, localized service, and continuous collaboration for scientific progress.
High-Performance and Universal Tungsten Filament SEM Microscope The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expandability.
Ultra High-Resolution Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.