CIQTEK Hosts Italian Partner Media System Lab for Award Ceremony and Strategic Visit
CIQTEK Hosts Italian Partner Media System Lab for Award Ceremony and Strategic Visit
November 13, 2025
CIQTEK was honored to welcome our esteemed Italian partner, Media System Lab, to CIQTEK for an inspiring visit and strategic collaboration. The visit marked another milestone in the strong partnership between the two companies, highlighting a shared commitment to advancing scientific innovation and excellence.
The journey began at CIQTEK Electron Microscopy Factory in Wuxi, where the Media System Lab team was deeply impressed by the scale, precision, and professionalism of CIQTEK’s electron microscopy production and R&D operations. They explored the full manufacturing process, witnessed the craftsmanship behind CIQTEK’s cutting-edge instruments, and gained first-hand insight into the company’s commitment to quality and innovation. Our technical experts also provided in-depth sessions on product knowledge and future development trends, further strengthening mutual understanding and trust.
Group photo at the CIQTEK Electron Microscopy Factory
Following the visit to CIQTEK Electron Microscopy Factory, the delegation traveled to CIQTEK's headquarters in Hefei, where both teams engaged in inspiring discussions on market promotion, customer engagement, and long-term strategies for expanding CIQTEK’s presence in Italy. The meetings involved Mr. Will Zhang, Head of the CIQTEK Electron Microscopy Business Group; Mr. Arvin Chen, Head of CIQTEK Overseas Business Group; and Mr. Yao, Head of the CIQTEK FIB PBU, fostering deeper alignment in technical support, service collaboration, and strategic planning.
Showing Media System Lab around the CIQTEK Exhibition Center
During the visit, CIQTEK CEO Dr. Yu He presented the "CIQTEK Distinguished Partner Award 2025" to Media System Lab, in recognition of their outstanding achievements, unwavering dedication, and exemplary performance. Over the past year, Media System Lab has played a key role in helping CIQTEK deliver nearly ten electron microscopes to Italian researchers and institutions, driving remarkable sales growth and significantly strengthening CIQTEK's brand presence and reputation in the local market.
CIQTEK Distinguished Partner Award 2025 Ceremony
The visit not only celebrated Media System Lab's exceptional contributions but also highlighted CIQTEK's global vision, commitment to excellence, and dedication to empowering partners worldwide. Together, CIQTEK and Media System Lab will continue to expand the reach of CIQTEK’s electron microscopy solutions, enabling more laboratories across Italy, Europe, and beyond to achieve breakthrough research and technological advancements. This collaboration underscores a shared pursuit of scientific progress, innovation, and long-term success in the field of electron microscopy and beyond.
Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM) The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.
Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.
Ultra High-Resolution Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.