This year, we officially formed a dedicated CIQTEK US team. That means more local presence, faster response, and closer communication with customers across the country.
And we are not staying behind a desk.
Our U.S. team, together with our official local distributor, JH Technologies, recently participated in the SMTA Wafer-Level Packaging Symposium 2026 and the 60th Anniversary Meeting of the Texas Society for Microscopy (TSM).
Supporting Advanced Packaging at SMTA 2026
At the SMTA Wafer-Level Packaging Symposium in San Francisco, we connected with engineers and technical experts working in advanced semiconductor packaging.
As devices continue to shrink, inspection and defect analysis become more demanding. Reliable SEM solutions USA customers can trust are more important than ever. We had open, practical conversations about real challenges in wafer-level packaging. Topics included imaging resolution, surface characterization, and process optimization.
These discussions help us better understand how the CIQTEK electron microscope can support advanced manufacturing and research applications.
CIQTEK and JH Technologies at the SMTA 2026
TSM 2026: The Start of Regional Engagement
The 60th Anniversary Meeting of the Texas Society for Microscopy was especially meaningful.
Unlike large national exhibitions, microscopy society events in the USA, such as TSM, allow for closer, more personal conversations. We met researchers, lab managers, and industry professionals from materials science, life sciences, and industrial labs.
For CIQTEK, TSM 2026 is the starting point of a broader plan. Our new CIQTEK US team will continue visiting regional microscopy societies across the country. We believe real relationships are built face-to-face.
CIQTEK at the TSM 2026
2026 Is Just the Beginning
The launch of our CIQTEK US team marks a new phase for CIQTEK electron microscope USA development.
We are investing in local support. We are building stronger partnerships. We are becoming part of the American microscopy ecosystem.
More regional visits are coming. More technical exchanges are ahead.
2026 is not just another year. It is the year CIQTEK steps closer to the U.S. microscopy community.
Ultra High-Resolution Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.
Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM) The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips. Contact our U.S. team: info.usa@ciqtek.com
Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.