CIQTEK to Exhibit at 16th ASEM Workshop 2026 in Austria
CIQTEK to Exhibit at 16th ASEM Workshop 2026 in Austria
March 12, 2026
CIQTEK will attend the 16th Austrian Society for Electron Microscopy (ASEM) Workshop on Advanced Electron Microscopy, taking place on April 20–21, 2026, at the Institute of Science and Technology Austria (ISTA) in Klosterneuburg, Austria.
The workshop brings together researchers, engineers, and microscopy experts to explore the latest advancements in electron microscopy technologies, SEM imaging, and scientific applications.
Showcasing CIQTEK Electron Microscopy Solutions
At the event, the CIQTEK Electron Microscopy EU team will introduce its scanning electron microscopy (SEM) and field emission SEM (FE-SEM) systems, highlighting applications in materials science, nanotechnology, semiconductor research, and life sciences. Participants can learn about CIQTEK's high-performance, reliable, and user-friendly electron microscopes designed to meet diverse research needs.
In addition, Dr. Fengfa Yao, senior EM solution scientist from the CIQTEK EU Electron Microscopy team, will deliver a technical presentation titled "Unlocking the Power of Unique High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low kV for Large Scale Volume Microscopy Applications from CIQTEK." The talk will introduce CIQTEK's latest advancements in high-speed SEM imaging, demonstrating how researchers can achieve rapid data acquisition while maintaining excellent low-kV imaging resolution, which is critical for large-scale volume microscopy applications.
Dedicated DACH Region Support
To better serve European clients, CIQTEK has established and is expanding its dedicated DACH region (Germany, Austria, Switzerland) Electron Microscopy team, providing localized sales, technical support, and service. This ensures rapid response and tailored solutions for research institutes and laboratories across the region.
Event Information
Event:16th ASEM Workshop on Advanced Electron Microscopy
Date: April 20–21, 2026
Location: Institute of Science and Technology Austria (ISTA), Klosterneuburg, Austria
High-Performance and Universal Tungsten Filament SEM Microscope The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expandability. Contact our U.S. team: info.usa@ciqtek.com
Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.
Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM) The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips. Contact our U.S. team: info.usa@ciqtek.com