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CIQTEK is the manufacturer and global supplier of high-value scientific instruments, such as Electron Microscopes, Electron Paramagnetic Resonance (Electron Spin Resonance), Gas Adsorption Analyzers, Scanning NV Microscopes, etc.
FESEM best price for sale
FESEM best price for sale

Field Emission Scanning Electron Microscope | SEM5000

CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed.

With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.

 

• High-resolution imaging at low accelerating voltage.

• Electromagnetic composite objective improves low-voltage resolution and enables magnetic specimen observation.

• High-pressure tunneling technology (SuperTunnel) ensures low voltage resolution.

• The electronic optical path without crossover effectively reduces system aberration and improves resolution.

• Water-cooled constant temperature objective lens, to ensure the stability, reliability, and repeatability of the objective lens work.

• Magnetic deflected six-hole various aperture system, with automatic switchable apertures, no mechanical adjustment needed, achieves high-resolution imaging or large beam analysis mode through a click-away fast switching.

 

Scanning Electron Microscope applications

Key Parameters Resolution

0.9 nm @ 15 kV, SE

1.3 nm @ 1.0 kV, SE

0.8 nm @ 30 kV, STEM

Acceleration Voltage 0.02 ~ 30 kV
Magnification 1 ~ 2,500,000 x
Electron Gun Type High brightness Schottky Field Emission Electron Gun
Specimen Chamber Vacuum System Fully Automatic Control, Oil-free Vacuum System
Camera Dual Cameras (Optical navigation + chamber monitor)
Stage Range

X: 125 mm, Y: 125 mm, Z: 50 mm

T: -10°~ +90°, R: 360°

(*Optional extra-large chamber version available)

Detectors and Extensions Standard

Inlens SE Detector

Everhart-Thornley Detector (ETD)

Optional

Flat Insertion Medium Angle Backscattered Electron Detector

STEM Automatic Retractable Scanning Transmission Electron Detector

Specimen Exchange Loadlock

Fast Beam Blanker

Energy Dispersive Spectroscopy (EDS/EDX)

Electron Backscatter Diffraction Pattern (EBSD)

Electron-beam-induced Current (EBIC)

Cathodoluminescence (CL)

In situ Tensile Stage

Nano Manipulator

Large-scale Image Stitching

Trackball & Knob Control Panel

Software Language English
Operating System Windows
Navigation Nav-Cam, Gesture Navigation
Automatic Functions Auto Brightness & Contrast, Auto Focus, Auto Stigmator

 

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