FESEM Field Emission Scanning Electron Microscope | SEM5000

CIQTEK SEM5000 is a field emission scanning electron microscope(FESEM) with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed.

With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.

Electron Gun
High-brightness Schottky Field Emission Electron Gun
Resolution
0.9nm @ 15kV, SE

1.3nm @ 1kV, SE

0.8nm @ 30kV, STEM
Magnification
1 ~ 2,500,000 x
Acceleration Voltage
0.02 ~ 30 kV
Specimen Stage
Five-axis automatic

• High-resolution imaging at low accelerating voltage.

• Electromagnetic composite objective improves low-voltage resolution and enables magnetic specimen observation.

• High-pressure tunneling technology (SuperTunnel) ensures low voltage resolution.

• The electronic optical path without crossover effectively reduces system aberration and improves resolution.

• Water-cooled constant temperature objective lens, to ensure the stability, reliability, and repeatability of the objective lens work.

• Magnetic deflected six-hole various aperture system, with automatic switchable apertures, no mechanical adjustment needed, achieves high-resolution imaging or large beam analysis mode through a click-away fast switching.

Scanning Electron Microscope applications

Key Parameters	Resolution	0.9 nm @ 15 kV, SE 1.3 nm @ 1.0 kV, SE 0.8 nm @ 30 kV, STEM
	Acceleration Voltage	0.02 ~ 30 kV
	Magnification	1 ~ 2,500,000 x
	Electron Gun Type	High brightness Schottky Field Emission Electron Gun
Specimen Chamber	Vacuum System	Fully Automatic Control, Oil-free Vacuum System
	Camera	Dual Cameras (Optical navigation + chamber monitor)
	Stage Range	X: 125 mm, Y: 125 mm, Z: 50 mm T: -10°～ +90°, R: 360° (*Optional extra-large chamber version available)
Detectors and Extensions	Standard	Inlens SE Detector Everhart-Thornley Detector (ETD)
Detectors and Extensions	Optional	Flat Insertion Medium Angle Backscattered Electron Detector STEM Automatic Retractable Scanning Transmission Electron Detector Specimen Exchange Loadlock Fast Beam Blanker Energy Dispersive Spectroscopy (EDS/EDX) Electron Backscatter Diffraction Pattern (EBSD) Electron-beam-induced Current (EBIC) Cathodoluminescence (CL) In situ Tensile Stage Nano Manipulator Large-scale Image Stitching Trackball & Knob Control Panel
Software	Language	English
	Operating System	Windows
	Navigation	Nav-Cam, Gesture Navigation
	Automatic Functions	Auto Brightness & Contrast, Auto Focus, Auto Stigmator

Hot Tags : Field Emission Scanning Electron Microscope manufacturer global supplier SEM EDX, EDS, EBSD, BSE, CL, STEM detectors high resolution FESEM best price High-brightness Schottky Field Emission Electron Gun Best Magnification Field Emission Scanning Electron Microscopy Field Emission Scanning Electron Microscope applications Field Emission Scanning Electron Microscope pdf Field Emission Scanning Electron Microscope notes

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