CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed.
With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
• High-resolution imaging at low accelerating voltage.
• Electromagnetic composite objective improves low-voltage resolution and enables magnetic specimen observation.
• High-pressure tunneling technology (SuperTunnel) ensures low voltage resolution.
• The electronic optical path without crossover effectively reduces system aberration and improves resolution.
• Water-cooled constant temperature objective lens, to ensure the stability, reliability, and repeatability of the objective lens work.
• Magnetic deflected six-hole various aperture system, with automatic switchable apertures, no mechanical adjustment needed, achieves high-resolution imaging or large beam analysis mode through a click-away fast switching.
0.9 nm @ 15 kV, SE
1.3 nm @ 1.0 kV, SE
0.8 nm @ 30 kV, STEM
|20 V ~ 30 kV
|1 ~ 2,500,000 x
|Electron Gun Type
|High brightness Schottky Field Emission Electron Gun
|Fully Automatic Control, Oil-free Vacuum System
|Dual Cameras (Optical navigation + chamber monitor)
X: 125 mm, Y: 125 mm, Z: 50 mm
T: -10°～ +90°, R: 360°
(*Optional extra-large chamber version available)
|Detectors and Extensions
Inlens SE Detector
Everhart-Thornley Detector (ETD)
Flat Insertion Medium Angle Backscattered Electron Detector
STEM Automatic Retractable Scanning Transmission Electron Detector
Specimen Exchange Loadlock
Fast Beam Blanker
Energy Dispersive Spectroscopy (EDS/EDX)
Electron Backscatter Diffraction Pattern (EBSD)
Electron-beam-induced Current (EBIC)
In situ Tensile Stage
Large-scale Image Stitching
Trackball & Knob Control Panel
|Nav-Cam, Gesture Navigation
|Auto Brightness & Contrast, Auto Focus, Auto Stigmator
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