CIQTEK to Showcase Advanced SEM Technology and U.S. Local Support at SEMS 2026

Stable, Versatile, Flexible, and Efficient   The CIQTEK SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.8 nm @ 1.0 kV, and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further. The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates a crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images of excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.

Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM)   The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.   Contact our U.S. team: info.usa@ciqtek.com

Ultra High-Resolution Tungsten Filament Scanning Electron Microscope   The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.