CIQTEK to Showcase Advanced SEM Technology and U.S. Local Support at SEMS 2026

Analytical Schottky Field Emission Scanning Electron Microscopy (FESEM)   The SEM5000XLV combines high-resolution imaging with high-current analytical capability and supports rapid switching between low-vacuum and high-current operating modes. It supports integration with optional EDS and EBSD modules, providing efficient characterization of challenging specimens and a comprehensive solution for localized microstructural and compositional analysis.     Contact our U.S. team: info.usa@ciqtek.com

Ultra High-Resolution Tungsten Filament Scanning Electron Microscope   The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.

High-Performance and Multi-Purpose Field Emission Scanning Electron Microscope   The SEM4000X (G2) is an ideal FE-SEM for microscale analysis and inspection. Combining stable, user-friendly  operation with a multi-detector system and beam-deceleration capabilities, it delivers high-resolution imaging at low landing voltages. Balancing performance, reliability, and total cost of ownership, it provides a dependable solution for modern materials-analysis laboratories.