CIQTEK to Exhibit at Egyptian Society of Electron Microscopy Conference 2025, Giza, Egypt

Analytical Schottky Field Emission Scanning Electron Microscopy (FESEM)   The SEM5000XLV combines high-resolution imaging with high-current analytical capability and supports rapid switching between low-vacuum and high-current operating modes. It supports integration with optional EDS and EBSD modules, providing efficient characterization of challenging specimens and a comprehensive solution for localized microstructural and compositional analysis.     Contact our U.S. team: info.usa@ciqtek.com

Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope   The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities.   The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.

High-Performance and Universal Tungsten Filament SEM Microscope   The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expandability.   Contact our U.S. team: info.usa@ciqtek.com