CIQTEK to Showcase Advanced Scientific and Oilfield Instruments at ARABLAB 2025 in Dubai

High-Performance and Universal Tungsten Filament SEM Microscope   The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expandability.

CIQTEK Climber Series — BET Specific Surface Area and Pore Size Analyzers are designed for fast, accurate, and stable testing. They can analyze up to 6 samples simultaneously, creating a brand-new testing experience.   ▪  Test the specific surface area and pore size distribution of solids, slurries, and powders ▪  0.0005 m2/g and above specific surface area analysis ▪  0.35 to 500 nm pore size analysis ▪  Five-point BET test can be completed within 20 minutes

The CIQTEK CAN400 is an intelligent liquid-state nuclear magnetic resonance (NMR) spectrometer. The spectrometer system consists of a superconducting magnet with ultra-high homogeneity and ultra-shielding, a multifunctional intelligent console, and a high-sensitivity fully automated tuning probe, along with other modules. CAN400 can include multiple highly integrated RF transceivers. The improved design enhances the performance of tuning, shimming, and auto sample changing, reducing experimental time. Accessories such as the intelligent touchscreen expand the management interface of the NMR system. Sample insertion and ejection can be controlled and monitored via a touchscreen, elevating the flexibility of various experiments. CAN400 combines high-performance hardware and intelligent software, providing users with a more reliable and convenient NMR experimental platform.

Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM)   The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope   The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities.   The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.