Successful Installation of CIQTEK's SEM3200 and SEM4000Pro at the GSEM Testing Center in Korea
Successful Installation of CIQTEK's SEM3200 and SEM4000Pro at the GSEM Testing Center in Korea
August 26, 2024
Suwon, Korea - In a significant development, leading scientific equipment distributor GSEM Korea has successfully installed cutting-edge SEM3200 and SEM4000Pro Scanning Electron Microscope (SEM)at its testing center in Korea.
The SEM3200 and SEM4000Pro SEM Microscopeof CIQTEKrepresent a breakthrough in modern high-resolution imaging. With advanced electron microscopy technology,these cutting-edge SEM Microscopeswill provide exceptional tools and platforms for Korean researchers and industry professionals, driving advancements in variousfields.
"We are thrilled with the installationof the SEM3200 and SEM4000Pro," saida research scientist at GSEM. "The high resolution and advanced imaging capabilities allow us to gain valuable insights intomicroscopicanalysis, enabling us to optimize and tailor their performance for specific applications. "
With an extensive sales network and a dedicated team of technical experts, GSEMremains committed to fostering scientific innovation and progress, providing excellent instrumentation, and delivering technical support for researchers and industry professionals in Korea. They collaborate with businesses and research institutions to drive the development of scientific research, making significant contributions to Korea's innovation and sustainable growth.
Analytical field emission scanning electron microscope (FESEM) equipped with a high-brightness long-life Schottky field emission electron gun With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.
High-performance tungsten filament SEM microscope with excellent imaging quality capabilities in both high and low vacuum modes The CIQTEK SEM3200 SEM Microscope has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.