News & Events

In the fields of high-temperature material performance research and phase transition mechanism analysis, traditional external heating methods often fail to combine precise micro-region temperature control with real-time observation.   CIQTEK, in collaboration with the Micro-Nano Center of the University of Science and Technology of China, has developed an innovative in-situ heating chip solution. By integrating MEMS heating chips with dual-beam electron microscopes, this solution enables precise temperature control (from room temperature to 1100°C) and micro-dynamic analysis of samples, offering a new tool for studying material behavior in high-temperature environments. This solution uses the CIQTEK dual-beam SEM and specialized MEMS heating chips, with temperature control accuracy better than 0.1°C and temperature resolution better than 0.1°C. The system also features excellent temperature uniformity and low infrared radiation, ensuring stable analysis at high temperatures. The system supports various characterization techniques during heating, including micro-region morphology observation, EBSD crystal orientation analysis, and EDS composition analysis. This allows for a comprehensive understanding of phase transitions, stress evolution, and composition migration under thermal effects.   The system operates without breaking the vacuum, fulfilling the full process requirements for sample preparation and characterization (in-situ micro-region EBSD).   The integrated workflow design covers the entire process, from sample preparation (ion beam processing, nano-manipulator extraction) to in-situ welding and heating tests. The system supports multi-angle operation, featuring a 45° heating chip and a 36° copper grid position, which meet the complex experimental needs. The system has been successfully applied in high-temperature performance research of alloys, ceramics, and semiconductors, helping users gain deeper insights into material responses in real-world environments.     September 26–30, Wuhan | 2025 Chinese National Conference on Electron MicroscopyCIQTEK's eight major electron microscopy solutions will be showcased!

CIQTEK has introduced its next-generation 12-inch wafer scanning electron microscope (SEM) solution, designed to meet the demands of advanced semiconductor manufacturing processes. Offering full-wafer inspection without the need for rotation or tilting, this innovative solution ensures high-resolution, non-destructive analysis to support critical process development. Equipped with an ultra-large travel stage (X/Y ≥ 300 mm), the system provides complete coverage of 12-inch wafers, eliminating the need for sample cutting or transfer. This ensures true "original size, original position" observation. With a Schottky field emission electron gun, it achieves a resolution of 1.0 nm at 15 kV and 1.5 nm at 1 kV, minimizing electron beam damage, making it ideal for sensitive materials and structures.     Key features include: Ultra-large travel stage (X/Y > 300 mm) for full-wafer inspection High-resolution imaging: 1.0 nm at 15 kV and 1.5 nm at 1 kV Automated loading and optical navigation system for fast wafer exchange and precise positioning Intelligent software for auto-focus, astigmatism correction, and multi-format image output   CIQTEK's 12-inch wafer inspection SEM is more than just an observation tool; it's a critical instrument driving higher yields and smaller nodes in semiconductor manufacturing.   September 26–30, WuhanCIQTEK will unveil eight cutting-edge electron microscopy solutions at the 2025 Chinese National Conference on Electron Microscopy!

In the fields of life sciences, biomedicine, food inspection, and soft matter research, achieving high-resolution imaging of hydrated and beam-sensitive samples has always been a major challenge. Conventional sample preparation methods, such as chemical fixation, dehydration, and drying, often result in shrinkage, deformation, or structural damage, leading to results that deviate from the true state of the sample.   Leveraging its advanced scanning electron microscopy technology, CIQTEK has introduced the Cryo-SEM Solution, which integrates low-temperature freezing and vacuum transfer. This enables in-situ, non-destructive, and high-fidelity microscopic observation of biological and sensitive samples, truly “freezing” the microscopic details of life.   With liquid-nitrogen slush rapid-freezing technology, samples can be vitrified instantly at -210 °C, preserving their original morphology and chemical composition to the greatest extent. The integrated cryo-preparation system combines freeze-fracture, sublimation coating, and low-temperature transfer, avoiding the complexity and potential errors of conventional manual preparation. Throughout the entire process, samples are maintained under cryogenic vacuum conditions and transferred to the SEM cryo-stage, where high-resolution imaging at -180 °C effectively suppresses electron beam damage and significantly improves image quality.   Cryo-prepared boxwood leaf showing intact vein structures, while the untreated sample exhibits severe shrinkage.   Yogurt   Mold Cryo-prepared yogurt sample clearly reveals protein networks and fungal hyphae.   In addition, the system offers strong compatibility, adaptable across CIQTEK's full range of SEMs and dual-beam FIBSEM systems, meeting diverse needs from routine observation to advanced analysis.   The CIQTEK Cryo-SEM Solution is more than just a set of instruments. It embodies a scientific approach dedicated to faithfully restoring the microscopic world. It empowers researchers to overcome technical limitations, capture critical details at the micro scale of life, and drive both fundamental research and applied development to new heights.   September 26–30, Wuhan At the 2025 Chinese National Electron Microscopy Academic Conference, CIQTEK will unveil eight cutting-edge EM solutions. Stay tuned!

CIQTEK is pleased to announce the successful installation and training of the FIBSEM DB550 at our Korean distributor GSEM’s Electron Microscope Center. This milestone marks an important step in expanding access to advanced focused ion beam scanning electron microscope (FIBSEM) technology in South Korea.     The DB550 combines high-resolution imaging with precise ion beam milling, enabling researchers to perform 3D reconstruction, cross-sectional analysis, and nanoscale material modification with efficiency and accuracy. With these capabilities, the system opens new possibilities for semiconductor analysis, materials science, and life science research. Following installation, CIQTEK engineers provided hands-on training to the GSEM team, covering both standard workflows and advanced applications. The interactive sessions ensured that users gained practical experience in operating the instrument, from sample preparation to high-resolution imaging and data analysis. The enthusiasm and engagement of the GSEM team highlighted the strong potential for the DB550 to support diverse research projects at the center.     This collaboration reflects CIQTEK’s commitment to working closely with partners worldwide. By equipping GSEM’s facility with the DB550, we are not only strengthening our presence in the Korean market but also helping local researchers gain access to cutting-edge tools for scientific innovation. We look forward to seeing the exciting results that GSEM’s Electron Microscope Center will achieve with the DB550, and we remain committed to providing ongoing technical support and collaboration.  

The 10th EFEPR Summer School, held at the University of Manchester, welcomed over 130 young researchers and established experts from across Europe for an inspiring week of lectures, tutorials, and hands-on sessions. CIQTEK, together with our UK partner SciMed, was proud to be part of this vibrant event dedicated to advancing Electron Paramagnetic Resonance (EPR) science.     At our booth, we presented the CIQTEK EPR200M benchtop spectrometer, a compact yet powerful platform designed for teaching labs, research groups, and emerging facilities. Many participants were excited to see how the instrument combines high performance with accessibility, sparking conversations about applications ranging from free radical studies to transition metal analysis. But science wasn’t the only highlight. To bring extra warmth to the event, we introduced our CIQTEK panda mascot—a plush companion that quickly became a favorite among attendees. The panda added a touch of fun, helping students relax and encouraging more open and engaging discussions. It was a great reminder that science can be both rigorous and joyful.     Throughout the week, our team enjoyed deep discussions on topics such as variable temperature experiments, modernization of legacy EPR systems, and the role of benchtop instruments in expanding access to EPR education. These exchanges reinforced our commitment to supporting both established laboratories and the next generation of researchers. A special thank you goes to our distributor SciMed for their strong support and collaboration throughout the event. Their expertise and enthusiasm helped create an inviting space where participants could explore new ideas and connect with the latest in EPR instrumentation.     We leave Manchester energized by the passion of the EFEPR community and look forward to continuing our contributions to global EPR education and research.

From August 24–29, 2025, CIQTEK participated in the Microscopy Conference 2025 (MC2025) held in Karlsruhe, Germany, one of Europe’s largest and most influential events in the field of electron microscopy. The conference attracted leading scientists, instrument developers, and industrial users, creating a dynamic platform for academic exchange and technological collaboration.     As part of the program, CIQTEK delivered an Exhibitor Presentation titled:“Unlocking the Power of High-Speed Scanning Electron Microscopy — without Compromising Superb Imaging Resolution at Low kV.” The presentation highlighted CIQTEK’s approach to enabling high-throughput SEM imaging while maintaining exceptional resolution at low accelerating voltages—a balance critical for applications in materials science, semiconductor failure analysis, and life sciences research. The talk generated considerable interest among attendees and sparked lively discussions about how advanced SEM systems can accelerate both fundamental research and industrial applications.     Beyond the presentation, the CIQTEK team actively engaged with researchers and industry professionals, sharing insights into the company’s broader electron microscopy portfolio and exploring opportunities for collaboration. These exchanges not only deepened awareness of CIQTEK’s technological strengths but also strengthened connections within the global microscopy community.     CIQTEK’s successful participation in MC2025 reflects its ongoing mission to push the boundaries of EM imaging technology and to provide researchers worldwide with powerful, accessible, and innovative solutions. Looking ahead, the company will continue to expand international partnerships and contribute to the advancement of microscopy-driven discovery.

Beyond Nano, the distributor of CIQTEK and a leading innovator in nanotechnology, proudly presented the CIQTEK SEM3200 at the 33rd International Materials Research Congress (IMRC 2025), Aug 17-21.     The IMRC is recognized as one of the most prestigious gatherings in materials science, bringing together global pioneers and thought leaders. This year, it provided Beyond Nano with the ideal platform to introduce CIQTEK’s cutting-edge SEM3200 Scanning Electron Microscope to an international audience. Engineered for advanced imaging, superior performance, and versatile applications, the CIQTEK SEM3200 is designed to meet the evolving needs of researchers across academia and industry.       Visitors at the Beyond Nano booth had the opportunity to experience the SEM3200’s groundbreaking capabilities firsthand and to engage with experts from the team about its features, application potential, and future developments. With the SEM3200, CIQTEK continues to expand the possibilities of electron microscopy, supporting researchers in unlocking new frontiers in materials science.

CIQTEK is pleased to invite you to visit us at the Egyptian Society of Electron Microscopy Conference 2025, held from October 13th to 15th, at the Theodor Bilharz Research Institute, Egypt.  The theme of this year's conference is: "The Importance of Electron Microscopy in Enlightening the Invisible". It reflects the profound impact that electron microscopy continues to have across diverse scientific disciplines, from biology to materials science.   Over the conference's three days, we will have the opportunity to engage in in-depth tutorials, keynote sessions, and explore the latest technological advancements in the field of Electron Microscopes. It will follow a Hybrid format, allowing participants from around the world to join us both in person and virtually, ensuring an inclusive and accessible experience for all.   Meet CIQTEK at ESEM2025 >> Date: October 13 - 15, 2025 >> Location: Theodor Bilharz Research Institute, Giza, Egypt