CIQTEK to Participate in the 60th Anniversary Meeting of the Texas Society for Microscopy (TSM 2026)
CIQTEK to Participate in the 60th Anniversary Meeting of the Texas Society for Microscopy (TSM 2026)
January 15, 2026
CIQTEK is pleased to announce its participation in the 60th Anniversary Meeting of the Texas Society for Microscopy (TSM), which will take place on February 19–20, 2026, at The University of Texas at Austin, USA.
Marking six decades of contributions to the microscopy community, TSM 2026 brings together researchers, facility managers, and industry professionals to discuss both the legacy and the future of microscopy. CIQTEK is honored to be part of this milestone event and to engage with the Texas and broader U.S. microscopy community.
Supporting Advanced Microscopy with Practical, High-Performance EM Solutions
At TSM 2026, CIQTEK will showcase its growing portfolio of electron microscopes (EM), designed to meet the evolving needs of academic research, shared facilities, and industrial laboratories.
CIQTEK's EM product line covers a wide range of applications, from routine imaging to advanced materials characterization, including:
FIB-SEM systems, delivering enhanced brightness and resolution for materials science and industrial inspection
Field Emission SEM (FE-SEM), engineered for high-resolution imaging, analytical workflows, and demanding research environments
Tungsten filament SEM, offering stable performance and cost-effective solutions for teaching labs and routine analysis
Across the portfolio, CIQTEK focuses on delivering reliable imaging performance, intuitive system operation, and long-term ownership value, helping laboratories achieve consistent results without unnecessary complexity.
Engaging with the Microscopy Community
CIQTEK views conferences like TSM not only as an opportunity to present instrumentation, but also as a platform for meaningful technical exchange. During the meeting, the CIQTEK team looks forward to discussing real-world microscopy challenges, system selection considerations, and long-term operational needs with users across materials science, life science, and industrial applications.
For attendees interested in learning more about CIQTEK EM solutions or exploring potential collaborations, CIQTEK warmly welcomes conversations during the meeting in Austin!
Local Support from CIQTEK USA
To better serve customers in North America, CIQTEK maintains a local branch in the United States, providing regional sales support, application consultation, and long-term service assistance for electron microscopy users.
For more information about CIQTEK EM solutions or to connect with the CIQTEK USA team, please contact us at info.usa@ciqtek.com.
120kV Field Emission Transmission Electron Microscope (TEM) 1. Divided Workspaces: Users operate TEM in a divided room with comfort reducing environmental interference to TEM. 2. High Operational Efficiency: Designated software integrates highly automated processes, allowing efficient TEM interaction with real-time monitoring. 3. Upgraded Operational Experience: Equipped with a field emission electron gun with a highly automated system. 4. High Expandability: There are sufficient interfaces reserved for users to upgrade to a higher configuration, which meets diverse application requirements.
Ultra High-Resolution Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.
Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.
Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM) The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.