On July 13, the 11th Analytica China was successfully concluded at the National Convention and Exhibition Center (Shanghai). As a lighthouse exhibition in the laboratory industry, this year's show gathered 1,273 exhibitors and cooperative units, and 56,864 professional visitors to join the grand event.
CIQTEK comprehensively demonstrated its advanced measurement technologies, products, and solutions centered on precision measurement technology at the conference, magnetic resonance, electron microscopy, gas adsorption analysis, and weak-signal measurement series products appearing in full and gaining a lot of attention.
Based on the self-developed Electron Paramagnetic Resonance Spectrometer (EPR) and Gas Adsorption Analyzer, CIQTEK's application experts shared the application of EPR, Specific Surface and Pore Size Analysis technologies in the field of environmental catalysis as well as Gas Adsorption Analysis technologies in the characterization of pharmaceuticals in the booth in the form of offline+online, which provided the solutions of domestically-made high-end scientific instruments for the application research in the related fields and attracted a large number of audiences to visit the booth and exchange ideas.
CIQTEK SEM5000 is a field emission scanning electron microscope(FESEM) with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
High-performance tungsten filament SEM microscope with excellent imaging quality capabilities in both high and low vacuum modes The CIQTEK SEM3200 SEM Microscope has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
Ultra-high resolution Field Emission Scanning Electron Microscopy (FESEM): 0.6 nm@15 kV and 1.0 nm@1 kV The CIQTEK SEM5000X ultra-high resolution FESEM utilizes the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design to improve low-voltage imaging resolution. The FESEM SEM5000X specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), significantly expanding the applications. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.
CIQTEK SEM5000Pro is a field emission scanning electron microscope (FESEM) with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and MFL objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
High-speed scanning electron microscope for cross-scale imaging of large-volume specimens CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. The imaging speed can reach more than 5 times faster than a conventional field emission scanning electron microscope (fesem).