CIQTEK Electron Microscopy Advances its Global Footprint at ESEM 2025 in Egypt
CIQTEK Electron Microscopy Advances its Global Footprint at ESEM 2025 in Egypt
October 13, 2025
CIQTEK is honored to have participated in the Egyptian Society of Electron Microscopy (ESEM) International Conference 2025, held October 13–15 at the Theodor Bilharz Research Institute (TBRI) in Giza, Egypt. This event convened electron microscopy experts, researchers, and industry representatives from across the Middle East, Africa, and beyond, advancing the frontiers of microscopy in both life sciences and materials research.
This year’s theme, “The Role of Electron Microscopy in Enlightening the Invisible”, resonated across sessions on neuropathology, renal biopsy, infectious agents, nanostructure imaging, and emerging microscopy techniques. TBRI played a central role in organizing the event, in cooperation with Egyptian universities such as Tanta and Assiut.
CIQTEK’s Contributions & Engagement
At ESEM 2025, CIQTEK showcased its SEM product line, including FIBSEM, FESEM, and Tungsten Filament SEM. Our booth drew interest from both biological and materials science researchers, keen to see real-sample imaging, low-voltage performance, and analytical integration.
CIQTEK Made the Presentation at the ESEM 2025
Beyond exhibits, CIQTEK representatives engaged in technical exchange, discussing how advanced SEM tools can bolster regional research infrastructure. We emphasized our commitment to delivering high-performing instruments, competitive pricing, and local support networks to facilitate adoption in diverse labs across the region.
Impact & Outlook
The conference underscored how microscopy continues to unveil the unseen—from cellular ultrastructure to nanomaterial phenomena. For many participants, this was a rare opportunity to access a wide spectrum of imaging techniques under one roof, and to converse directly with vendors like CIQTEK.
By engaging with local scientists and institutions, CIQTEK deepens its global reach and contributes to the growth of microscopy in underrepresented regions. We look forward to continuing our support in Africa and the Middle East through instrument installations, training, and responsive service.
Analytical Schottky Field Emission Scanning Electron Microscope (FESEM) CIQTEK SEM4000Pro is an analytical FE-SEM model equipped with a high-brightness and long-life Schottky field emission electron gun. Its three-stage electromagnetic lens design offers significant advantages in analytical applications such as EDS / EDX, EBSD, WDS, and more. The model comes standard with a low-vacuum mode and high-performance low-vacuum secondary electron detector, as well as a retractable backscattered electron detector, which benefits the observation of poorly conductive or non-conductive specimens.
High-Performance and Universal Tungsten Filament SEM Microscope The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expandability.
Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.