CIQTEK at Pittcon Conference and Expo 2024, #1638

X-band Benchtop Electron Paramagnetic Resonance or Electron Spin Resonance (EPR, ESR) Spectrometer The CIQTEK EPR200M is a newly designed benchtop EPR spectrometer specializing in the qualitative and quantitative analysis of free radicals, transition metal ions, material doping and defects. It is an excellent research tool for real-time monitoring of chemical reactions, in-depth evaluation of material properties, and exploration of pollutant degradation mechanisms in environmental science. The EPR200M adopts a compact design and highly integrates the microwave source, magnetic field, probe, and main controller, ensuring sensitivity and stability while being compatible with diverse experimental needs. The user-friendly interface allows even first-time users to start quickly, making the EPR instrument truly easy to use.   ★ Email our experts for custom solutions, quotes, or detailed brochures: info@ciqtek.com  

Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM)   The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

High Resolution under Low Excitation   The CIQTEK SEM5000Pro is a Schottky field emission scanning electron microscope (FE-SEM) specialized at high resolution even under low excitation voltage. Employing an advanced "Super-Tunnel" electron optics technology facilitates a crossover-free beam path together with an electrostatic-electromagnetic compound lens design. These advancements reduce spatial charging effect, minimize lens aberrations, enhance imaging resolution at low voltage, and achieve a resolution of 1.2 nm at 1 kV, which allows for direct observation of non-conductive or semi-conductive samples, effectively reducing sample irradiation damage.

High-speed Fully Automated Field Emission Scanning Electron Microscope Workstation   CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. Its imaging speed is over five times faster than that of a conventional field emission scanning electron microscope (FESEM).

High-performance and Universal Tungsten Filament SEM Microscope   The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities.

Ultra High-Resolution Tungsten Filament Scanning Electron Microscope   The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.

Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope   The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities.   The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.

120kV Field Emission Transmission Electron Microscope (TEM)   1. Divided Workspaces: Users operate TEM in a divided room with comfort reducing environmental interference to TEM. 2. High Operational Efficiency: Designated software integrates highly automated processes, allowing efficient TEM interaction with real-time monitoring. 3. Upgraded Operational Experience: Equipped with a field emission electron gun with a highly automated system.  4. High Expandability: There are sufficient interfaces reserved for users to upgrade to a higher configuration, which meets diverse application requirements.

Modernize your old EPR spectroscopy for the cutting-edge EPR research   This Modernize will bring you features including: ▶ Higher Sensitivity: Ultra-low noise microwave source and signal detection technology. ▶ Better Resolution: Precise magnetic field control technology ▶ Excellent Compatibility: Compatible with a wide range of EPR spectrometers. ▶ Fast Delivery: Complete delivery of the modernized hardware within 2 to 6 months. ▶ High-quality Service: On-site installation and 2-year warranty.   ★ Email us for more details: info@ciqtek.com

CIQTEK SEM5000 is a field emission scanning electron microscope(FESEM) with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.