Pittcon is a dynamic, transnational conference and exposition on laboratory science, a venue for presenting thelatest advances in analytical research and scientific instrumentation, and a platform for continuing education andscience-enhancing opportunity. Pitcon is for anyone who develops, buys, or sells laboratory equipmentperforms physical or chemical analyses, develops analysis methods, or manages these scientists.
· Meet us at Booth 1638: We look forward to meeting you at our booth, where we will be presenting solutions based on EPR and Scanning Electron Microscope. We will have a real working electron microscope on display, so please take the opportunity to discuss with our experts and try it out.
Date: Feb 24 - 28, 2024
Location: San Diego Convention Center,111 Harbor Dr, San Diego, CA
The CIQTEK EPR200M is an X-band benchtop electron paramagnetic resonance/electron spin resonance (EPR or ESR) spectroscopy. Based on its high sensitivity and stability, EPR200M offers an economical, low-maintenance, and user-friendly experience for EPR study and analysis.
CIQTEK SEM5000 is a field emission scanning electron microscope(FESEM) with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
CIQTEK DB500 is a Field Emission Scanning Electron Microscope (FE-SEM) with a Focused Ion Beam (FIB) column for nano analysis and specimen preparation, which is applied with “SuperTunnel” electron optics technology, low aberration, and magnetic-free objective lens design, with low-voltage and high-resolution ability that ensures its nano-scale analytical capability. The ion column facilitates a Ga+ liquid metal ion source with a highly stable and high-quality ion beam to ensure nano-fabrication capability. DB500 has an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and 24 expansion ports, making it an all-around nano-analysis and fabrication platform with comprehensive configurations and expandability.
CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design, SEM5000X can achieve further improvements in low-voltage imaging resolution. The specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), greatly expanding applications' coverage. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.
CIQTEK SEM5000Pro is a field emission scanning electron microscope (FESEM) with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and MFL objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope with excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.