News & Events

CIQTEK will join Neuroscience 2026, the annual meeting of the Society for Neuroscience, in Washington, D.C. from November 14 to 18. Visit us at Booth #1014 to explore how high-speed electron microscopy can support large-scale biological imaging, connectomics, and volume electron microscopy workflows. Neuroscience 2026 will take place at the Walter E. Washington Convention Center and brings together neuroscientists, imaging specialists, technology providers, and researchers from around the world. High-Speed SEM for Large-Scale Biological Imaging Modern neuroscience increasingly depends on imaging larger areas, larger volumes, and more complex biological structures. For volume electron microscopy, imaging speed matters, but speed alone is not enough. Researchers also need stable low-kV performance, reliable image quality, automated acquisition, and workflows that can handle large datasets efficiently. At Neuroscience 2026, CIQTEK will highlight the HEM6000 High-Speed SEM, developed for demanding applications in biological imaging and large-area electron microscopy. Its capabilities support workflows such as: High-speed large-area imaging Low-kV high-resolution observation Automated image acquisition Serial section imaging Volume EM and 3D reconstruction Neuroscience and connectomics research The goal is to help researchers collect high-quality structural information faster while reducing the time and effort required for large-scale imaging projects. Explore CIQTEK Electron Microscopy Solutions In addition to high-speed SEM, CIQTEK offers a broader electron microscopy portfolio for biological and materials research, including field emission SEM and FIB-SEM systems. Our team will be available to discuss practical questions around sample imaging, throughput, resolution, automation, and workflow design. If you are working with brain tissue, neural structures, connectomics, biological ultrastructure, or large-volume imaging, we would be glad to learn more about your research and discuss which electron microscopy approach may fit your needs. Date: November 14–18, 2026Location: Walter E. Washington Convention Center, Washington, D.C., USACIQTEK Booth: #1014 Meet the CIQTEK team at Booth #1014 and see how faster electron microscopy can support your next neuroscience imaging project.  

Sometimes the most useful microscopy conversations happen away from a formal presentation, with a sample, an image, or a practical question on the table. That was our experience at the 2026 Great Lakes Microscopy Society Annual Meeting, held on October 9 at Michigan Technological University in Houghton, Michigan. CIQTEK joined researchers, students, and microscopy professionals working across electron microscopy, microanalysis, materials science, and biological research. Microscopy Questions, Not Just Instrument Specs Throughout the meeting, our U.S. Electron Microscopy Team had the chance to talk with attendees about what they actually need from an SEM workflow, from routine imaging and materials characterization to higher-resolution and more specialized applications. CIQTEK also shared its broader electron microscopy portfolio, covering field emission SEM, tungsten SEM, high-speed SEM, and FIB-SEM solutions for different research needs. Good Science Starts with Good Conversations GLMS is a smaller, focused meeting, and that made it especially easy to have direct conversations with people doing hands-on microscopy every day. Thank you to everyone who stopped by, asked questions, shared your research, or simply came over for a microscopy chat. For our team, meetings like GLMS are valuable because they help us understand how researchers are actually using electron microscopy, where the challenges are, and what they expect from the next generation of instruments. We look forward to staying connected with the Great Lakes microscopy community and continuing the conversations started in Michigan.

Failure analysis rarely starts with a perfect sample. At ISTFA 2026, the 52nd International Symposium for Testing and Failure Analysis, many of our conversations began with real-world challenges: buried defects, difficult cross sections, subtle material contrast, and structures that require more than surface-level imaging. From October 4 to 8 in San Antonio, Texas, CIQTEK U.S. Electron Microscopy Team met with failure analysis engineers, semiconductor researchers, and microscopy specialists at Booth #317 to discuss practical SEM and FIB-SEM workflows. From Surface Imaging to Buried Defect Analysis Discussions at ISTFA covered a wide range of applications, including: Semiconductor device and wafer inspection High-resolution low-kV imaging Surface defect and morphology analysis Material contrast and contamination analysis Site-specific cross-sectioning Buried defect and interface characterization SEM helps reveal surface morphology, interfaces, particles, and material contrast, while FIB-SEM extends the analysis beneath the surface through precise milling and targeted cross-section preparation. CIQTEK also introduced its electron microscopy solutions, including the SEM5000 Series and DB550 FIB-SEM, for semiconductor failure analysis and advanced materials characterization. Valuable Conversations at Booth #317 Beyond instrument specifications, many discussions focused on real laboratory needs such as sample type, imaging conditions, detector configuration, workflow efficiency, and cross-section quality. These conversations gave our team valuable insight into the challenges faced by semiconductor and failure analysis laboratories in the U.S. Thank you to everyone who visited our booth and shared your applications and ideas with us. We look forward to continuing the conversation and supporting more laboratories with practical electron microscopy solutions for failure analysis and defect characterization.

CIQTEK will participate in the 2026 Great Lakes Microscopy Society (GLMS) Annual Meeting on October 9, 2026, at Michigan Technological University in Houghton, Michigan. The meeting brings together researchers, students, and microscopy professionals working across electron microscopy, microanalysis, materials science, and biological research.   Meet the CIQTEK U.S. EM Team At GLMS 2026, CIQTEK will showcase its electron microscopy solutions for a wide range of research applications. Our portfolio includes field emission SEM, tungsten SEM, high-speed SEM, and FIB-SEM. Our U.S. Electron Microscopy Team will be on-site to connect with attendees and discuss real microscopy applications and workflow needs. Experienced EM Solution Managers will also be available to answer technical questions and help researchers explore suitable microscopy solutions for their labs.   Date: October 9, 2026Location: Michigan Technological University, Houghton, Michigan, USA See you at GLMS 2026!  

CIQTEK will participate in ISTFA 2026, the 52nd International Symposium for Testing and Failure Analysis, taking place from October 4 to 8 in San Antonio, Texas. Visit us at Booth #317 to explore CIQTEK SEM and FIB-SEM solutions for semiconductor failure analysis, defect characterization, and advanced electron microscopy. Our U.S. Electron Microscopy Team, including experienced EM Solution Managers, will be on site to discuss your applications and help identify the right microscopy solutions for your lab.   Meet the Failure Analysis Community at ISTFA 2026 Organized by ASM International, ISTFA is a leading international event for microelectronics testing and failure analysis, bringing together engineers, researchers, laboratory professionals, and technology providers from the semiconductor industry. The conference focuses on real-world challenges in failure analysis, device characterization, microscopy, defect localization, reliability, and related technologies.   SEM for Semiconductor Failure Analysis As semiconductor devices become smaller and more complex, failure analysis requires high-resolution imaging and reliable information from increasingly fine structures. CIQTEK offers a range of field emission scanning electron microscopes, including the SEM5000X, SEM5000, and SEM4000Pro, for semiconductor and advanced materials characterization. Our SEM solutions can support applications such as: Semiconductor device and wafer inspection Surface defect and morphology analysis High-resolution low-kV imaging BSE imaging for material contrast Particle and contamination analysis Electronic components and packaging characterization Low-kV SEM imaging is especially valuable when examining fine surface structures and sensitive features. Combined with flexible detector options and BSE imaging, it helps researchers obtain both structural and material information from complex samples.   Go Deeper with FIB-SEM Not every failure can be understood from the surface. For buried defects, interfaces, and internal structures, FIB-SEM combines focused ion beam processing with high-resolution SEM imaging, enabling targeted cross-section preparation and analysis within the same system. CIQTEK DB550 FIB-SEM systems support applications including site-specific cross-sectioning, internal defect investigation, multilayer structure analysis, interface characterization, and advanced sample preparation. This gives failure analysis teams a powerful way to move from locating a problem to investigating what is happening beneath the surface.   Talk with Our U.S. EM Team at Booth #317 Choosing the right electron microscope is not only about specifications. Sample type, imaging requirements, throughput, workflow, chamber capacity, detectors, and future applications all matter. That is why our U.S. Electron Microscopy Team will be on site at ISTFA 2026, with experienced EM Solution Managers available to answer technical questions and discuss your specific applicat...

CIQTEK will join the 2026 vEM Technology Forum at Peking University in Beijing, showcasing our latest Volume Electron Microscopy (Volume EM) solutions. Visitors can meet the CIQTEK team at our booth to explore how high-speed SEM, low-kV high-resolution imaging, automated large-area acquisition, and 3D reconstruction can help researchers handle increasingly large and complex volume microscopy datasets. CIQTEK Poster Presentation At the forum, Dr. Changming Liu (Noah), CIQTEK Senior Electron Microscopy Solution Manager, will present our latest work on high-speed SEM for large-scale Volume EM. Poster Title:Unlocking the Power of Unique High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low kV for Large Scale Volume Microscopy Applications from CIQTEK The poster will explore how the HEM6000 combines high imaging speed, strong low-kV resolution, large-area imaging, and intelligent automation to support large-scale Volume EM workflows. Meet CIQTEK in Beijing The 2026 vEM Technology Forum brings together researchers and microscopy experts to exchange ideas around Volume EM technologies, workflows, automation, large-scale imaging, data processing, and emerging applications. We look forward to meeting the vEM community, sharing our latest developments, and hearing about the real imaging challenges researchers are working on. Visit the CIQTEK booth, meet our EM team, and discover what high-speed Volume EM can bring to your research. Date: October 11–15, 2026Location: Peking University, Beijing, China See you in Beijing!

CIQTEK has successfully wrapped up its participation at SCM2026, the Spin Chemistry Meeting in Padua, Italy. The meeting brought together researchers working in spin chemistry and related fields, creating a valuable opportunity for the CIQTEK European Magnetic Resonance Team to connect with the scientific community and exchange ideas around EPR, NMR, and advanced magnetic resonance applications.   During SCM2026, the CIQTEK team also introduced its latest EPR and NMR solutions, including modernization and upgrade options designed to help researchers extend the capabilities and service life of their existing magnetic resonance systems.   For CIQTEK, the meeting was not only about presenting technology. It was also another opportunity to listen to researchers, understand their needs, build new connections, and continue strengthening CIQTEK's magnetic resonance presence in Europe.       Connecting with the Spin Chemistry Community at SCM2026 Spin chemistry brings together researchers from a range of scientific backgrounds, with Electron Paramagnetic Resonance (EPR) and Nuclear Magnetic Resonance (NMR) playing important roles in understanding molecular structures, dynamics, reaction mechanisms, and other fundamental processes.   SCM2026 provided a focused environment for researchers to exchange ideas and discuss developments in the field. Throughout the meeting, the CIQTEK European Magnetic Resonance Team connected with researchers and discussed their work in spin chemistry, EPR, NMR, and related magnetic resonance applications.   At the Spin Chemistry Meeting 2026, CIQTEK shared its growing portfolio of EPR and NMR solutions with the research community.   CIQTEK's EPR spectrometer solutions are designed to support researchers studying systems containing unpaired electrons and can serve a wide range of research areas and experimental requirements.   CIQTEK's NMR spectrometer solutions provide another important platform for researchers who need detailed information about molecular structure and behavior.   By developing both EPR and NMR technologies, CIQTEK continues to expand its capabilities across magnetic resonance and provide researchers with more options for their laboratories.   Just as importantly, our conversations at SCM2026 were not limited to new instruments.   EPR and NMR Modernization and Upgrade Solutions Many laboratories already have EPR or NMR systems that have supported their research for years. In these cases, purchasing a completely new system is not always the only option.   At SCM2026, CIQTEK also introduced its EPR modernization and upgrade and NMR modernization and upgrade solutions.   These solutions are designed for laboratories looking to extend the capabilities and useful lifetime of existing magnetic resonance systems. Depending on the existing instrument and research requirements, modernization can provide a practical path for updating key parts of the...

CIQTEK and Queen Mary University of London invite researchers, scientists, laboratory managers, and technical specialists to join a free EPR seminar and workshop in London on October 21, 2026. Bringing together EPR experts from leading universities across Europe, this one-day event will introduce the fundamentals of Electron Paramagnetic Resonance (EPR) spectroscopy, share current research applications and case studies, and offer practical guidance for researchers who are using EPR or considering it for their work. The event is free to attend, and lunch and refreshments will be provided. Places are limited, so early registration is recommended. > Register now: https://buff.ly/MwgaNlw EPR Seminar and Workshop Event Information Date: Wednesday, October 21, 2026Time: 10:00 am to 4:00 pmLocation: G.O. Jones Building, Queen Mary University of London, Mile End, LondonAttendance: FreeCatering: Lunch and refreshments included Updated Programme: Speaker Topics Now Available The latest programme is now available, with presentation topics confirmed for most of the invited speakers. The day will bring together different perspectives on EPR, spanning molecular systems, bioinorganic chemistry, molecular qubits, quantum science, and next-generation EPR instrumentation. The current programme includes: 10:00 am | Opening RemarksDr. Junjie LiuLecturer in Physics and Royal Society University Research FellowQueen Mary University of London Prof. Eric McInnesProfessor of Inorganic Chemistry, The University of ManchesterEPR Studies of Molecular Actinide Complexes Dr. Will MyersScientific Applications Manager, Department of Chemistry, University of OxfordEPR of Biometalloclusters: Oxygen Evolving Centre, Hydrogenase, and Nitrogenase Prof. Dr. Joris van SlagerenProfessor, Institute of Physical Chemistry, University of StuttgartMolecular Qubits: From Spin Dynamics to Devices Prof. Stergios PiligkosProfessor, Department of Chemistry, University of CopenhagenCoherent Manipulation of Molecular Qubit Subspaces 12:10 pm–1:30 pm | Lunch Dr. Alice BowenReader in Analytical, Measurements and Physical Chemistry, The University of ManchesterAdventures in Light-induced EPR Prof. Arzhang ArdavanProfessor of Physics, University of OxfordDemonstrating Experimentally the Encoding and Dynamics of an Error-Correctable Logical Qubit on a Hyperfine-Coupled Nuclear Spin Qudit Dr. Zhiyu (Jeff) SunDirector of Magnetic Resonance Applications, CIQTEKNext Generation EPR: Advanced X, Q, and W Band Instrumentation with AI Enhanced Spectral Processing Additional invited speakers may also join the event. The final programme and individual presentation times will be updated accordingly. Explore EPR Spectroscopy from Fundamentals to Real Applications EPR spectroscopy is a powerful technique for studying materials and systems containing unpaired electrons. It can provide valuable information about free radicals, defects, transition-metal ions, paramagnetic centers, and many other systems that c...