FESEM | SEM4000X(G2)

High-Performance and Multi-Purpose Field Emission Scanning Electron Microscope

The SEM4000X (G2) is an ideal FE-SEM for microscale analysis and inspection. Combining stable, user-friendly operation with a multi-detector system and beam-deceleration capabilities, it delivers high-resolution imaging at low landing voltages. Balancing performance, reliability, and total cost of ownership, it provides a dependable solution for modern materials-analysis laboratories.

High Resolution
Multi-Detector Technology
Simplified Alignment

Built from a Higher-End Platform
*Ultra Beam Deceleration Mode Technology
Excellent Expandability

▶ Electron Optics

▶ Particle & Pore Analysis Software (Particle) *Optional

SEM Particle & Pore Analysis Software (Particle)

The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.

▶ Image Post-processing Software *Optional

SEM Microscope Image Post-processing Software

Perform online or offline image post-processing on images captured by electron microscopes and integrate commonly used EM image processing functions, convenient measurement, and annotation tools.

▶ Auto Measure *Optional

Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Support multiple edge detection modes, such as Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various commonly used image post-processing functions. The software is easy to use, efficient, and accurate.

▶ Software Development Kit (SDK) *Optional

SEM Microscope Software Development Kit (SDK)

Provide a set of interfaces for controlling the SEM microscope, including image acquisition, operating condition settings, power on/off, stage control, etc. Concise interface definitions allow for the rapid development of specific electron microscope operation scripts and software, enabling automated tracking of regions of interest, industrial automation data acquisition, image drift correction, and other functions. Can be used for software development in specialized areas such as diatom analysis, steel impurity inspection, cleanliness analysis, raw material control, etc.

▶ AutoMap *Optional

CIQTEK FESEM SEM4000X Introduction

Inside CIQTEK Factory: Electron Microscope Manufacturing Tour

CIQTEK SEM4000X FESEM Microscope Specifications
Electron Optics	Resolution	0.9 nm @ 30 kV, SE 1.0 nm @15 kV, SE 1.8 nm @1 kV, SE 1.5 nm @1 kV (Ultra beam deceleration) 0.8 nm @15 kV (Ultra beam deceleration)
	Acceleration Voltage	0.2 kV ~ 30 kV
	Magnification (Polaroid)	1 ~ 1,000,000 x
	Electron Gun Type	Schottky Field Emission Electron Gun
Specimen Chamber	Camera	Dual Cameras (Optical navigation + chamber monitoring)


	Stage Range	X: 110 mm Y: 110 mm Z: 65 mm T: -10°~ +70° R: 360°
SEM Detectors and Extensions	Standard	In-lens Electron Detector: UD-BSE/UD-SE Everhart-Thornley Detector: LD
SEM Detectors and Extensions	Optional	Backscattered Electron Detector (BSED) Retractable Scanning Transmission Electron Microscopy Detector (STEM) Low Vacuum Detector (LVD) Energy Dispersive Spectrometer (EDS / EDX) Electron Backscatter Diffraction Pattern (EBSD) Specimen Exchange Loadlock (4 inch /8 inch) Trackball & Knob Control Panel Ultra Beam Deceleration Mode Technology
User Interface	Language	English
	OS	Windows
	Navigation	Optical Navigation, Gesture Quick Navigation, Trackball (optional)
	Automatic Functions	Auto Brightness & Contrast, Auto Focus, Auto Stigmator

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