Ultra-High Resolution Schottky FESEM | SEM5000Ultra

Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope   The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities.   The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.

High-speed Fully Automated Field Emission Scanning Electron Microscope Workstation   CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. Its imaging speed is over five times faster than that of a conventional field emission scanning electron microscope (FESEM).

Analytical Schottky Field Emission Scanning Electron Microscopy (FESEM)   The SEM5000XLV combines high-resolution imaging with high-current analytical capability and supports rapid switching between low-vacuum and high-current operating modes. It supports integration with optional EDS and EBSD modules, providing efficient characterization of challenging specimens and a comprehensive solution for localized microstructural and compositional analysis.     Contact our U.S. team: info.usa@ciqtek.com

Ultra-High Resolution Schottky  Field Emission Scanning Electron Microscope The SEM5000Pro (G2) field-emission scanning electron microscope is designed for stability, reliability, ease of use, and productivity, bringing field-emission imaging capabilities to a wide range of laboratories. Combining ultra-high spatial resolution with long-term operating stability, it consistently delivers high-quality images for applications ranging from advanced nanomaterials characterization to semiconductor R&D and manufacturing, meeting the demanding needs of research institutions and industrial quality-control laboratories.  

High-Performance and Multi-Purpose Field Emission Scanning Electron Microscope   The SEM4000X (G2) is an ideal FE-SEM for microscale analysis and inspection. Combining stable, user-friendly  operation with a multi-detector system and beam-deceleration capabilities, it delivers high-resolution imaging at low landing voltages. Balancing performance, reliability, and total cost of ownership, it provides a dependable solution for modern materials-analysis laboratories.  

High-Performance and Universal Tungsten Filament SEM Microscope   The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expandability.   Contact our U.S. team: info.usa@ciqtek.com

Easy-to-Use Compact Tungsten Filament Scanning Electron Microscope   The CIQTEK SEM2100 SEM Microscope features a simplified operating process and adheres to industry standards and user habits in its "User Interface" design. Despite the minimalist software interface, it provides comprehensive automated functions, measurement and annotation tools, image post-processing management capabilities, optical image navigation, and more. The design of SEM2100 perfectly realizes the idea of "Simplicity without sacrificing functionality".

Read the CIQTEK SEM Microscopes customer insights and learn more about CIQTEK's strengths and achievements as the SEM industry leader!   Email: info@ciqtek.com