The CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope, designed for those who demand excellence in imaging. It delivers exceptional image quality with high-resolution visuals and an expansive depth of field, ensuring rich detail and dimension in every image.
SEM3200 also offers a low vacuum mode, allowing for the direct observation of non-conductive samples without the need for coating. Its extended scalability makes it compatible with various detectors and tools, including SE, BSE, EDS, and EBSD.
For scientists, the SEM3200 provides numerous benefits:
· High-resolution imaging: Achieve stunning clarity and detail.
· Versatility: Flexible sample positioning with a five-axis eucentric stage.
· Scalability: Seamlessly integrate additional detectors and analytical tools to extend functionality.
· User-friendly interface: Simplifies complex imaging tasks, enhancing productivity and research outcomes.
These features empower researchers to push the boundaries of their work, from material science to biological studies.
High-performance tungsten filament SEM microscope with excellent imaging quality capabilities in both high and low vacuum modes The CIQTEK SEM3200 SEM Microscope has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.