CIQTEK Strengthens Partnerships at Analytica Africa 2025

High-Performance and Universal Tungsten Filament SEM Microscope   The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expandability.

Ultra-High Resolution Field Emission Scanning Electron Microscopy (FESEM)   The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

High-speed Fully Automated Field Emission Scanning Electron Microscope Workstation   CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. Its imaging speed is over five times faster than that of a conventional field emission scanning electron microscope (FESEM).

The CIQTEK CAN600 is a next-generation intelligent liquid-state nuclear magnetic resonance (NMR) spectrometer, equipped with an ultra-shielded, ultra-homogeneous 600 MHz superconducting magnet, an advanced distributed system architecture with a modular integrated console, and high-sensitivity, fully automated tuning probes. The CAN600 features highly integrated transceiver RF channels, enabling multi-receiver experiments. Its novel design supports rapid tuning and shimming, significantly reducing the time required for experiment setup. Accessories such as the intelligent control touchscreen expand the system’s management, allowing users to monitor instrument status and control sample access directly via touch, enhancing the flexibility of NMR experiments. By combining high-performance hardware with intelligent software, CAN600 delivers a more reliable and user-friendly NMR platform for researchers.

X-Band Benchtop Electron Paramagnetic Resonance Spectrometer The CIQTEK EPR200M is a newly designed benchtop EPR spectrometer specializing in the qualitative and quantitative analysis of free radicals, transition metal ions, material doping and defects. It is an excellent research tool for real-time monitoring of chemical reactions, in-depth evaluation of material properties, and exploration of pollutant degradation mechanisms in environmental science. The EPR200M adopts a compact design and highly integrates the microwave source, magnetic field, probe, and main controller, ensuring sensitivity and stability while being compatible with diverse experimental needs. The user-friendly interface allows even first-time users to start quickly, making the EPR instrument truly easy to use.   ★ Email our experts for custom solutions, quotes, or detailed brochures: info@ciqtek.com  

CIQTEK Climber Series — BET Specific Surface Area and Pore Size Analyzers are designed for fast, accurate, and stable testing. They can analyze up to 6 samples simultaneously, creating a brand-new testing experience.   ▪  Test the specific surface area and pore size distribution of solids, slurries, and powders ▪  0.0005 m2/g and above specific surface area analysis ▪  0.35 to 500 nm pore size analysis ▪  Five-point BET test can be completed within 20 minutes

Ultra High-Resolution Tungsten Filament Scanning Electron Microscope   The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.