Cheonan, South Korea — CIQTEK has taken another important step forward in Asia with the installation of the DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) at CLARE Science Research Institute in Cheonan, South Korea.
The new setup allows researchers and industrial users in South Korea to experience high-resolution imaging, precise nano-machining, and advanced analytical performance offered by the CIQTEK DB550. The system provides outstanding quality for microstructural modification, 3D slice-and-view analysis, and automated TEM lamella preparation, supporting a wide range of applications in semiconductor failure analysis, display technology, materials science, and R&D.
Located in Cheonan's Mirae Ace High-Tech City, CLARE Science Research Institute is a prominent research and analytical organization in South Korea dedicated to advanced material characterization, nano-scale testing, and high-precision microanalysis. Serving major industry leaders such as Samsung Semiconductor and Samsung Display, as well as prominent universities and research institutes, CLARE provides tailored analytical solutions, technical expertise, and consultation.
Now, CLARE Science Research Institute’s testing facility features a fully operational CIQTEK DB550, offering hands-on demonstrations and analytical services for visitors and clients to explore its dual-beam capabilities, intuitive software interface, and versatility across complex semiconductor and display inspection workflows.
“Having the CIQTEK DB550 available in our laboratory allows us to showcase its advanced FIB-SEM performance directly to our clients and elevate our testing service capabilities for key industry partners like Samsung Semiconductor and Samsung Display,” said a representative from CLARE Science Research Institute. “It is a great addition to our analytical facilities and an important step in expanding our high-end microscopy offerings.”
With the DB550 now operational in South Korea, local users can directly evaluate its performance and access cutting-edge FIB-SEM technology, supported by CLARE’s local expertise and technical services. This collaboration marks a significant milestone in CIQTEK’s ongoing effort to enhance accessibility to advanced electron microscopy solutions across the Asia-Pacific region.
