Focused Ion Beam Scanning Electron Microscope | DB500 suppliers,Focused Ion Beam Scanning Electron Microscope | DB500 manufacturers,Focused Ion Beam Scanning Electron Microscope

Focused Ion Beam Scanning Electron Microscope | DB500

CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, low aberration, and magnetic-free objective lens design, with low-voltage and high-resolution ability that ensures its nano-scale analytical capability. The ion column facilitates a Ga+ liquid metal ion source with a highly stable and high-quality ion beam to ensure nano-fabrication capability.

DB500 is equipped with an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and 24 expansion ports, making it an all-around nano-analysis and fabrication platform with comprehensive configurations and expandability.

SuperTunnel
Gallium Ion Beam
Fully Configured

Gas Injection System
Integrated Manipulator
Excellent Warranty

• “SuperTunnel” Electron Optics technology with a magnetic-free objective lens, suitable for high-resolution imaging, and compatible with magnetic specimen imaging.

• The focused ion beam column which outputs a highly stable, high-quality ion beam, suitable for high-quality nano-fabrication and TEM specimen preparation.

• A piezoelectrically-driven manipulator located in the specimen chamber with an integrated control system for precise handling.

• Independently developed system with strong expandability. The integrated ion source assembly design for quick ion source exchange. Excellent service, supported by an included three-year warranty.

Focused Ion Beam Column

Resolution: 3 nm@30 kV

Probe current (Ion beam current range): 1 pA~50 nA

Acceleration voltage range: 0.5~30 kV

Ion source exchange interval: ≥1000 hours

Stability: 72 hours of uninterrupted operation

Nano-manipulator

Chamber internally mounted

Three-axis all-piezoelectrically driven

Stepper motor accuracy ≤10 nm

Maximum travel speed 2 mm/s

Integrated control

Ion Beam-Electron Beam Collaboration

Gas Injection System

Single GIS design

Various gas precursor sources are available

Needle insertion distance ≥35 mm

Motion repeatability ≤10 μm

Heating temperature control repeatability ≤0.1°C

Heating range: room temperature ~ 90°C(194°F)

Integrated control

Electron Beam System	Electron Gun Type	High Brightness Schottky Field Emission Electron Gun
	Resolution	1.2 nm@15 kV
	Acceleration Voltage	0.02~30 kV
Ion Beam System	Ion Source Type	Liquid Gallium Ion Source
	Resolution	3 nm@30 kV
	Acceleration Voltage	0.5~30 kV
Specimen Chamber	Vacuum System	Fully Automatic Control, Oil-free Vacuum System
	Cameras	Three Cameras (Optical navigation + chamber monitor x2)
	Stage Type	5-axis Mechanical Eucentric Specimen Stage
	Stage Range	X=110 mm, Y=110 mm, Z=65 mm T: -10°~+70°, R:360°
Detectors and Extensions	Standard	In-lens Detector Everhart-Thornley Detector (ETD)
Detectors and Extensions	Optional	Retractable Back-Scattered Electron Detector (BSED) Retractable Scanning Transmission Electron Microscopy Detector (STEM) Energy Dispersive Spectrometer (EDS) Electron Backscatter Diffraction Pattern (EBSD) Nano-manipulator Gas Injection System Plasma Cleaner Specimen Exchange Loadlock Trackball & Knob Control Panel
Software	Languages	English
	Operating System	Windows
	Navigation	Nav-Cam, Gesture Quick Navigation
	Automatic Functions	Auto Brightness & Contrast, Auto Focus, Auto Stigmator

Video: CIQTEK DB500 (Dual Beam Scanning Electron Microscope)

Gold Wire
30 kV / ETD
IC Chip #1
1 kV / ETD
IC Chip #2
1 kV / ETD

Hot Tags : Focused Ion Beam Scanning Electron microscope global supplier FIB Scanning Electron Microscope manufacturer global supplier FIB SEM FE SEM Best price for sale FIB SEM FE SEM pdf application notes slides SEM Imaging analysis with Focused Ion Beam (FIB) FIB SEM Detector EBSD BSED STEM EDS ETD Inlens Field Emission Scanning Electron Microscope with a Focused Ion Beam column Focused Ion Beam SEM introduction

Leave A Message

Please feel free to contact us for more details, request a quote or book an online demo! We will reply you as soon as we can.

Subject : Focused Ion Beam Scanning Electron Microscope | DB500

Submit

Related Products

Field Emission Scanning Electron Microscope | SEM5000

CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.

Learn More

Field Emission Scanning Electron Microscope | SEM4000

CIQTEK SEM4000 is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design and the large continuously adjustable beam current, SEM4000 delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode, which can help directly observe poorly conductive or even non-conductive specimens. Standard optical navigation mode, as well as an intuitive user operation interface, makes your analysis work easy.

Learn More

Tungsten Filament Scanning Electron Microscope | SEM3200

CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.

Learn More

Ultra-high Resolution Field Emission Scanning Electron Microscope for sale

Ultra-high Resolution Field Emission Scanning Electron Microscope | SEM5000X

CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design, SEM5000X can achieve further improvements in low-voltage imaging resolution. The specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), greatly expanding applications' coverage. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.

Learn More