CIQTEK SEM4000 is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun.
With the three-stage condenser electron optics column design and the large continuously adjustable beam current, SEM4000 delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode, which can help directly observe poorly conductive or even non-conductive specimens. Standard optical navigation mode, as well as an intuitive user operation interface, makes your analysis work easy.
• Equipped with high brightness and long-life Schottky field emission electron gun
• High resolution, better than 1nm resolution at 30 kV
• Three-stage condenser lens design, wide beam current adjustable range
• *High-performance low vacuum secondary electron detectors, observe poorly conductive or non-conductive specimens
• Non-immersion magnetic field free objective lens design, can directly observe magnetic specimens
• Standard optical navigation mode
Key Parameters | Resolution |
1 nm @ 30 kV, SE 0.9 nm @ 30 kV, STEM |
Acceleration Voltage | 200 V ~ 30 kV | |
Magnification | 1 ~ 1,000,000 x | |
Electron Gun Type | High Brightness Schottky Field Emission Electron Gun | |
Specimen Chamber | Vacuum System | Fully Automated Control |
Low Vacuum (Optional) | Max 180Pa | |
Camera | Dual Cameras (Optical navigation + chamber monitoring) | |
Stage Range |
X: 120 mm Y: 115 mm Z: 50 mm T: -10°~ +90° R: 360° |
|
Detectors and Extensions | Standard | Everhart-Thornley Detector (ETD) |
Optional |
Low Vacuum Detector (LVD) Backscattered Electron Detector (BSE) STEM Detector Energy Dispersive Spectrometer (EDS) Electron Backscatter Diffraction Pattern (EBSD) Specimen Exchange Loadlock Trackball & Knob Control Panel |
|
Software | Language | English |
OS | Windows | |
Navigation | Nav-Cam, Gesture Quick Navigation | |
Automatic Functions | Auto Brightness & Contrast, Auto Focus, Auto Stigmator |