CIQTEK Scanning Electron Microscope Facilitates Research on Advanced Energy Storage Materials
CIQTEK Scanning Electron Microscope Facilitates Research on Advanced Energy Storage Materials
August 08, 2023
Energy storage is considered to be the last step in the development of new energy, and is the key to whether new energy can play a major role and whether it can realize the goal of "carbon neutrality".
As a new type of energy storage technology, supercapacitors, with high power density, low temperature, long cycle life, wide operating temperature range, and other characteristics, can be widely used in new energy vehicles, wind power, photovoltaic power generation, as well as consumer electronics, has attracted much attention in recent years. To further improve the performance of supercapacitors, in addition to the existing technology, but also to consider the development of new technologies and new materials, the Shandong Advanced Electromagnetic Drive Technology Research Institute of Researchers Sun has deep and extensive research on this.
To meet the demand for research on various types of energy storage materials, the group of researcher Sun introduced in October 2021 a tungsten filament scanning electron microscope (SEM) independently developed by CIQTEK. It is understood that scanning electron microscopy is an important research tool in materials science, which is mainly applied in the study of material structure, morphology, composition, properties, and failure analysis. At present, the materials tested by the Institute using the CIQTEK SEM include activated carbon, metal oxides, soft carbon, hard carbon, and other electrode materials. At the same time, the group also uses SEM to analyze the causes of failure of supercapacitors and battery monomers.
"The previous electron microscope required taking a picture with a cell phone to remember the sample location before selecting the sample. The scanning electron microscope of CIQTEK has an optical navigation function, which makes it very intuitive to find the sample after it is put in. Compared with past electron microscopes, the biggest feature of the scanning electron microscope of CIQTEK is the convenient operation and high degree of automation, all the operations can be completed through the mouse point and click, with no need to operate the mouse and knob, it is convenient to move the sample and select the sample, and it is very easy to get started." Talking about the experience of using CIQTEK SEM, researcher Sun gave this example.
This perfect automation function is suitable for students without too much experience and greatly optimizes the cost of personnel training. The good experience of using the scanning electron microscope makes researcher Sun look forward to the development of the CIQTEK scanning electron microscope.
CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.
CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
CIQTEK SEM4000 is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design and the large continuously adjustable beam current, SEM4000 delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode, which can help directly observe poorly conductive or even non-conductive specimens. Standard optical navigation mode, as well as an intuitive user operation interface, makes your analysis work easy.
CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design, SEM5000X can achieve further improvements in low-voltage imaging resolution. The specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), greatly expanding applications' coverage. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.