CIQTEK at Analytica Lab Africa 2023, Johannesburg, South Africa
CIQTEK at Analytica Lab Africa 2023, Johannesburg, South Africa
May 08, 2023
Analytica Lab Africa 2023
Period: 2023.07.05-07.07 Location: Gallagher Convention Center, Johannesburg, South Africa
Website: https://analytica-africa.com/
About Analytica Lab Africa 2023
Analytica Lab Africa is the only trade fair for laboratory technology, analysis, biotechnology and diagnostics in South Africa. The show features both local and international market leaders, addressing visitors in South Africa and Sub-Saharan Africa.
Meet Us at the Booth No. E53
Come to the exhibition site to visit the CIQTEK booth #E53! Take a closer look at our scanning electron microscopes, automated BET surface area analyzers, and other advanced scientific instruments!
We also have some great gifts for our visitors! Cannot wait to see you there!
CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design, SEM5000X can achieve further improvements in low-voltage imaging resolution. The specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), greatly expanding applications' coverage. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.