SEM: Interview with Prof. Xiaochun Liu, Changsha University of Science & Technology, China
SEM: Interview with Prof. Xiaochun Liu, Changsha University of Science & Technology, China
October 12, 2022
In September 2022, CIQTEK Scanning Electron Microscope (SEM) was delivered to Prof. Xiaochun Liu's team, which has been commissioned and officially put into operation. Through a short interview, Prof. Liu shared his experience of using CIQTEK SEM. In the video, Prof. Liu said that thanks to the excellent functions and superb value of CIQTEK SEM, the future working time will be very happy.
At present, CIQTEK has launched field emission scanning electron microscope and tungsten filament scanning electron microscope.
CIQTEK Field Emission Scanning Electron Microscope SEM5000
CIQTEK Field Emission Scanning Electron Microscope SEM5000
The SEM5000 is a high-resolution, feature-rich field emission scanning electron microscope. With an advanced lens barrel design, the lens barrel has a deceleration, low aberration, and no magnetic leakage objective lens design, which realizes low-voltage high-resolution imaging, and can be applied to magnetic samples at the same time. SEM5000 has optical navigation, complete automatic functions, well-designed human-computer interaction, and optimized operation and use procedures. Regardless of whether the operator has extensive experience, they can quickly get started and complete high-resolution shooting tasks.
CIQTEK Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK Tungsten Filament Scanning Electron Microscope SEM3200
The SEM3200 is a high-performance, versatile general-purpose tungsten filament scanning electron microscope. It has excellent image quality, is compatible with low vacuum mode, and can obtain high-resolution images in different fields of view. Large depth of field, the imaging is full of three-dimensional effects.
CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
CIQTEK SEM4000 is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design and the large continuously adjustable beam current, SEM4000 delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode, which can help directly observe poorly conductive or even non-conductive specimens. Standard optical navigation mode, as well as an intuitive user operation interface, makes your analysis work easy.
CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.
CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design, SEM5000X can achieve further improvements in low-voltage imaging resolution. The specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), greatly expanding applications' coverage. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.