CIQTEK at 2023 Annual Beijing Electron Microscopy Conference, Beijing, China
CIQTEK at 2023 Annual Beijing Electron Microscopy Conference, Beijing, China
March 08, 2023
On February 26, the 2023 Beijing Annual Conference of Electron Microscopy was successfully held in Beijing, hosted by the Electron Microscopy Professional Committee of the Beijing Physical and Chemical Analysis and Testing Technology Society. CIQTEK was invited to attend this conference to show the latest achievements of SEM, which received an enthusiastic response.
2022 Annual Beijing Electron Microscopy Conference Site
This conference aims to promote the academic and technical level of electron microscopy in Beijing and surrounding provinces and cities at large, to promote the application, development, and communication of electron microscopists in the fields of materials science and life science, etc. Many experts and scholars are invited to make advanced electron microscopy presentations.
In the report, the application expert of CIQTEK shared "the latest progress of Scanning Electron Microscope".
The SEM3300 is a new generation of tungsten filament scanning electron microscope with a resolution better than 2.5 nm and a special electronic circuit design that breaks through the resolution limit of tungsten filament and 5 nm at a low voltage of 1 kV. Excellent image quality, and high-resolution images can be obtained in different fields of view. Large depth of field for stereoscopic images. Extensive scalability to help you explore the world of microscopic imaging.
SEM5000 adopts advanced barrel design, high voltage tunneling technology (SuperTunnel), and low aberration non-leakage magnetic objective design, to achieve low-voltage high-resolution imaging, while magnetic samples can be applied. With optical navigation, perfect automatic functions, well-designed human-machine interaction, and optimized operation and use process, regardless of experience or not, you can quickly get started with high-resolution shooting tasks.
Currently, CIQTEK has launched three tungsten filament SEMs and two field emission SEMs.
CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed. With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.
CIQTEK SEM4000 is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design and the large continuously adjustable beam current, SEM4000 delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode, which can help directly observe poorly conductive or even non-conductive specimens. Standard optical navigation mode, as well as an intuitive user operation interface, makes your analysis work easy.
CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefiting from the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design, SEM5000X can achieve further improvements in low-voltage imaging resolution. The specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), greatly expanding applications' coverage. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.
CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.